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| BAS116H Datasheet, PDF (5/9 Pages) NXP Semiconductors – 75 V, low leakage diode in small SOD123F package | |||
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Philips Semiconductors
8. Test information
BAS116H
75 V, low leakage diode in small SOD123F package
RS = 50 â¦
V = VR + IF Ã RS
D.U.T.
IF
SAMPLING
OSCILLOSCOPE
Ri = 50 â¦
VR
mga881
tr
tp
10 %
90 %
input signal
(1) IR = 1 mA
Fig 5. Reverse recovery time test circuit and waveforms
t
+ IF
trr
t
(1)
output signal
9397 750 14881
Product data sheet
Rev. 01 â 11 April 2005
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
5 of 9
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