74LV27 Datasheet, PDF (5/10 Pages) NXP Semiconductors – Triple 3-input NOR gate

Philips Semiconductors
Triple 3-input NOR gate
Product specification
74LV27
DC ELECTRICAL CHARACTERISTICS (Continued)
Over recommended operating conditions. Voltages are referenced to GND (ground = 0V).
LIMITS
SYMBOL PARAMETER
TEST CONDITIONS
-40°C to +85°C
MIN
TYP¹ MAX
I_CC
Quiescent supply
current; SSI
V_CC = 5.5V; V_I = V_CC or GND; I_O = 0
20.0
Additional
∆I_CC quiescent supply V_CC = 2.7V to 3.6V; V_I = V_CC – 0.6V
500
current
NOTE:
1. All typical values are measured at T_amb = 25°C.
-40°C to +125°C
MIN
MAX
40
850
UNIT
µA
µA
AC CHARACTERISTICS
GND = 0V; t_r = t_f ≤ 2.5ns; C_L = 50pF; R_L = 1KΩ
SYMBOL
PARAMETER
WAVEFORM
CONDITION
V_CC(V)
1.2
t_PHL/PLH
Propagation delay
nA, nB, nC to nY
Figures 1, 2
2.0
2.7
3.0 to 3.6
4.5 to 5.5
NOTES:
1. Unless otherwise stated, all typical values are measured at T_amb = 25°C
2. Typical values are measured at V_CC = 3.3 V.
LIMITS
–40 to +85 °C
MIN TYP¹ MAX
50
17
22
13
16
10²
13
11
–40 to +125 °C
MIN MAX
27
20
16
14
UNIT
ns
AC WAVEFORMS
V_M = 1.5 V at V_CC ≥ 2.7 V and ≤ 3.6 V;
V_M = 0.5 × V_CC at V_CC < 2.7 V and ≥ 4.5 V;
V_OL and V_OH are the typical output voltage drop that occur with the
output load.
VI
nA, nB, nC
INPUT
GND
VOH
nY OUTPUT
VOL
VM
t _PHL
VM
t _PLH
SV00420
Figure 1. Input (nA, nB, nC) to output (nY) propagation delays.
TEST CIRCUIT
V_cc
PULSE
GENERATOR
V_l
R_T
D.U.T.
V_O
50pF
C_L
R_L= 1k
Test Circuit for Outputs
DEFINITIONS
R_L = Load resistor
C_L = Load capacitance includes jig and probe capacitiance
R_T = Termination resistance should be equal to Z_OUT of pulse generators.
TEST
t_PLH/t_PHL
V_CC
< 2.7V
2.7–3.6V
≥ 4.5 V
V_I
V_CC
2.7V
V_CC
SV00902
Figure 2. Load circuitry for switching times.
1998 Apr 20
5