74F827 Datasheet, PDF (5/12 Pages) NXP Semiconductors – 10-bit buffer/line driver, non-inverting 3-State

Philips Semiconductors
Buffers
Product specification
74F827, 74F828
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
V_IH
V_IL
I_IK
I_OH
I_OL
T_amb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
LIMITS
UNIT
Min
Nom
Max
4.5
5.0
5.5
V
2.0
V
0.8
V
–18
mA
–24
mA
64
mA
0
+70
°C
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX ^UNIT
V_OH
High-level output voltage
V_CC = MIN,
"10%V_CC
2.4
V
V_IL = MAX,
V_IH = MIN
I_OH = –15mA _"5%VCC
2.4 3.3
V
V_CC = MIN,
"10%V_CC
2.0
V
V_IL = MAX,
V_IH = MIN
I_OH = –24mA _"5%VCC
2.0
V
V_OL
Low-level output voltage
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_{OL = MAX}
"10%V_CC
"5%V_CC
0.55
V
0.42 0.55
V
V_IK
I_I
I_IH
I_IL
I_OZH
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Off-state output current,
High voltage applied
V_CC = MIN, I_I = I_IK
V_CC = 0.0V, V_I = 7.0V
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_O = 2.7V
–0.73 –1.2
V
100 µA
20
µA
–20 µA
50
µA
I_OZL
Off-state output current,
Low voltage applied
V_CC = MAX, V_O = 0.5V
–50 µA
I_OS
Short circuit output current³
V_CC = MAX
–100
–225 mA
I_CCH
50
70 mA
74F827
I_CCL
V_CC = MAX
70
100 mA
I_CC
Supply current
(total)
I_CCZ
I_CCH
60
90 mA
30
45 mA
74F828
I_CCL
V_CC = MAX
65
85 mA
I_CCZ
55
70 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_A = 25°C.
3. Not more than one output should be shorted at one time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1994 Dec 05
5