74F640 Datasheet, PDF (5/11 Pages) NXP Semiconductors – Octal bus transceiver, inverting 3-State

Philips Semiconductors
Octal bus transceiver, inverting (3-State)
Product specification
74F640
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS^{NO TAG}
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
V_OH
High-level output voltage
A0–A7
B0–B7
V_CC = MIN,
V_IL = MAX,
I_OH = –3mA
±10%V_CC
±5%V_CC
2.4
2.7
3.3
B0–B7 ^{VIH = MIN}
I_OH = –15mA
±10%V_CC
±5%V_CC
2.0
2.0
V
V
V
V
±10%V_CC
A0–A7
V_CC = MIN,
I_OL = 24mA
±5%V_CC
V_OL
Low-level output voltage
B0–B7
V_IL = MAX,
V_IH = MIN,
I_OL = MAX
±10%V_CC
±5%V_CC
0.35 0.50
V
0.35 0.50
V
0.55
V
0.42 0.55
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
–0.73 –1.2
V
I_I
Input current at maximum
input voltage
OE,
T/R
V_CC = 0.0V, V_I = 7.0V
A0–A7,
B0–B7
V_CC = 5.5V, V_I = 5.5V
100
µA
1.0
mA
I_IH
High-level input current
OE, V_CC = MAX, V_I = 2.7V
T/R
I_IL
Low-level input current
only V_CC = MAX, V_I = 0.5V
40
µA
–40
µA
I_OZH+I_IH
Off-state output current,
High level of voltage applied
V_CC = MAX, V_I = 2.7V
70
µA
I_OZL+I_IL
Off-state output current,
Low level of voltage applied
V_CC = MAX, V_I = 0.5V
–70
µA
I_OS
Short-circuit output cur-
rent^{NO TAG}
A0–A7
V_CC = MAX
B0–B7
–60
–100
–150
mA
–225
µA
I_CCH
T/R = An = 4.5V,
OE = GND
66
85
mA
I_CC
Supply current (total)
I_CCL V_CC = MAX T/R = Bn = OE = GND
91
120
mA
I_CCZ
T/R = Bn = GND,
OE = 4.5V
78
102
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1989 Nov 27
5