74F545 Datasheet, PDF (5/10 Pages) NXP Semiconductors – Octal bidirectional transceiver with 3-State inputs/outputs

Philips Semiconductors
Octal bidirectional transceiver (with 3-State inputs/outputs)
Product specification
74F545
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX
UNIT
V_OH
High-level output voltage
A0–A7
B0–B7
B0–B7
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OH = –3mA
I_OH = –15mA
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
2.4
2.7
2.0
2.0
3.3
V
V
V
V
V_OL
Low-level output voltage
A0–A7
B0–B7
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OL = 24mA
I_OL = MAX
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
0.35 0.50
V
0.35 0.50
V
0.55
V
0.42 0.55
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
–0.73 –1.2
V
OE, T/R
I_I
Input current at
maximum input voltage
A0–A7,
B0–B7
V_CC = 0.0V, V_I = 7.0V
V_CC = 5.5V, V_I = 5.5V
100
µA
1.0
mA
I_IH
I_IL
I_OZH+I_IH
High-level input current
Low-level input current
Off-state output current
High-level voltage applied
OE, T/R
only
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_I = 2.7V
40
µA
–40
µA
70
µA
I_OZL+I_IL
Off-state output current
Low-level voltage applied
V_CC = MAX, V_I = 0.5V
–70
µA
I_OS
Short-circuit output
current³
A0–A7
B0–B7
V_CC = MAX
–60
–100
–150
mA
–225
µA
I_CCH
T/R=An=4.5V, OE=GND
I_CC
Supply current (total)⁴
I_CCL
V_CC = MAX OE=T/R =Bn=GND
84
100
mA
96
120
mA
I_CCZ
T/R=Bn=GND, OE=4.5V
96
120
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS should be performed last.
4. Measure I_CC with outputs open.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
t_PLH
t_PHL
t_PZH
t_PZL
t_PHZ
t_PLZ
Propagation delay
An to Bn, Bn to An
Output Enable time
to High or Low level
Output Disable time
from High or Low level
TEST
CONDITIONS
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
LIMITS
T_amb = +25°C
V_CC = +5.0V
C_L = 50pF, R_L = 500Ω
MIN TYP MAX
T_amb = 0°C to +70°C
V_CC = +5.0V ± 10%
C_L = 50pF, R_L = 500Ω
MIN
MAX
1.5
3.5
5.5
1.5
6.5
2.5
4.5
6.5
2.5
7.0
6.0
8.5
10.5
6.0
11.0
5.5
8.0
9.5
5.5
10.0
2.5
5.0
7.0
2.5
8.0
2.0
4.5
6.5
2.0
7.5
UNIT
ns
ns
ns
ns
ns
ns
1990 Mar 01
5