74F540N Datasheet, PDF (5/10 Pages) NXP Semiconductors – Octal inverter buffer (3- State)

Philips Semiconductors
Buffers
Product specification
74F540, 74F541
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS^{NO TAG}
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
V_OH
High-level output voltage
V_OL
Low-level output voltage
±10%V_CC 2.4
V
V_CC = MIN,
I_OH = –3mA
±5%V_CC
2.7
3.4
V
V_IL = MAX,
V_IH = MIN
±10%V_CC 2.0
V
I_OH = –15mA _±5%VCC
2.0
V
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OL = MAX
±10%V_CC
±5%V_CC
0.55
V
0.42 0.55
V
V_IK
Input clamp voltage
I_I
Input current at maximum input
voltage
V_CC = MIN, I_I = I_IK
V_CC = 0.0V, V_I = 7.0V
–0.73 –1.2
V
100
µA
I_IH
I_IL
I_OZH
High-level input current
Low-level input current
Off-state output current
High-level voltage applied
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_O = 2.7V
20
µA
–20
µA
50
µA
I_OZL
Off-state output current
Low-level voltage applied
V_CC = MAX, V_O = 0.5V
–50
µA
I_OS
Short-circuit output current^{NO TAG}
V_CC = MAX
–100
–225
mA
I_CCH
In=OEn=GND
22
30
mA
74F540 I_CCL
In=4.5V, OEn=GND
58
75
mA
I_CC
Supply current
(total)
I_CCZ
I_CCH
V_CC = MAX
In=GND, OEn=4.5V
In=4.5V, OEn=GND
40
55
mA
30
40
mA
74F541 I_CCL
In=OEn=GND
55
72
mA
I_CCZ
In=GND, OEn=4.5V
45
58
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS should be performed last.
1990 Jan 08
5