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P87LPC760 Datasheet, PDF (49/56 Pages) NXP Semiconductors – Low power, low price, low pin count (14 pin) microcontroller with 1 kbyte OTP
Philips Semiconductors
Low power, low price, low pin count (14 pin)
microcontroller with 1 kbyte OTP
Preliminary data
P87LPC760
DC ELECTRICAL CHARACTERISTICS
VDD = 2.7 V to 6.0 V unless otherwise specified; Tamb = 0 °C to +70 °C, unless otherwise specified.
SYMBOL
PARAMETER
IDD
Power supply current, operating
TEST CONDITIONS
MIN
5.0 V, 20 MHz11
–
3.0 V, 10 MHz11
–
LIMITS
TYP1,2
15
4
MAX
25
7
UNIT
mA
mA
5.0 V, 6 MHz11
IRC
Power supply current, operating RC Osc.
3.0 V, 6 MHz11
–
4
–
mA
–
2
–
mA
IID
Power supply current, Idle mode
5.0 V, 20 MHz11
3.0 V, 10 MHz11
–
6
10
mA
–
2
4
mA
5.0 V11
IPD
Power supply current, Power Down mode 3.0 V11
–
1
10
µA
–
1
5
µA
VRAM RAM keep-alive voltage
1.5
–
–
V
VIL
Input low voltage (TTL input)
4.0 V < VDD < 6.0 V
2.7 V < VDD < 4.0 V
–0.5
–
0.2 VDD–0.1
V
–0.5
–
0.7
V
VIL1 Negative going threshold (Schmitt input)
–0.5
–
0.3 VDD
V
VIH
Input high voltage (TTL input)
0.2 VDD+0.9
–
VDD+0.5
V
VIH1 Positive going threshold (Schmitt input)
0.7VDD
–
VDD+0.5
V
HYS Hysteresis voltage
–
0.2 VDD
–
V
VOL
Output low voltage all ports5, 9
IOL = 3.2 mA, VDD = 2.7 V
–
–
0.4
V
VOL1 Output low voltage all ports5, 9
IOL = 20 mA, VDD = 2.7 V
–
–
1.0
V
VOH
VOH1
Output high voltage, all ports3
Output high voltage, all ports4
IOH = –20 µA, VDD = 2.7 V
VDD–0.7
–
–
V
IOH = –30 µA, VDD = 4.5 V
VDD–0.7
–
–
V
IOH = –1.0 mA, VDD = 2.7 V VDD–0.7
–
–
V
CIO
Input/Output pin capacitance10
–
–
15
pF
IIL
Logical 0 input current, all ports8
VIN = 0.4 V
–
–
–50
µA
ILI
Input leakage current, all ports7
VIN = VIL or VIH
–
–
±2
µA
ITL
Logical 1 to 0 transition current, all ports3, 6 VIN = 1.5 V at VDD = 3.0 V
VIN = 2.0 V at VDD = 5.5 V
–30
–150
–
–
–250
µA
–650
µA
RRST Internal reset pull-up resistor
40
–
225
kΩ
VBOLOW Brownout trip voltage with BOV = 112
2.35
–
2.69
V
VBOHI Brownout trip voltage with BOV = 0
3.45
–
3.99
V
VREF Reference voltage
1.11
1.26
1.41
V
NOTES:
1. Typical ratings are not guaranteed. The values listed are at room temperature, 5 V.
2. See other Figures for details.
3. Ports in quasi-bidirectional mode with weak pull-up (applies to all port pins with pull-ups). Does not apply to open drain pins.
4. Ports in PUSH-PULL mode. Does not apply to open drain pins.
5. In all output modes except high impedance mode.
6. Port pins source a transition current when used in quasi-bidirectional mode and externally driven from 1 to 0. This current is highest when
VIN is approximately 2 V.
7. Measured with port in high impedance mode. Parameter is guaranteed but not tested at cold temperature.
8. Measured with port in quasi-bidirectional mode.
9. Under steady state (non-transient) conditions, IOL must be externally limited as follows:
Maximum IOL per port pin:
20 mA
Maximum total IOL for all outputs:
80 mA
Maximum total IOH for all outputs:
5 mA
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed
test conditions.
10. Pin capacitance is characterized but not tested.
11. The IDD, IID, and IPD specifications are measured using an external clock with the following functions disabled: comparators, brownout
detect, and watchdog timer. For VDD = 3 V, LPEP = 1. Refer to the appropriate figures on the following pages for additional current drawn by
each of these functions and detailed graphs for other frequency and voltage combinations.
12. Devices initially operating at VDD = 2.7 V or above, and at fOSC = 10 MHz or less, are guaranteed to continue to execute instructions
correctly at the brownout trip point. Initial power-on operation below VDD = 2.7 V is not guaranteed.
13. Devices initially operating at VDD = 4.0 V or above and at fOSC = 20 MHz or less are guaranteed to continue to execute instructions correctly
at the brownout trip point. Initial power-on operation below VDD = 4.0 V and fOSC > 10 MHz is not guaranteed.
2002 Mar 07
46