MB2541 Datasheet, PDF (4/12 Pages) NXP Semiconductors – Dual octal buffer line driver 3-State

Philips Semiconductors
16-bit buffer/line drivers (3-State)
Product specification
MB2541
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
V_I
V_IH
V_IL
I_OH
I_OL
∆t/∆v
T_amb
DC supply voltage
Input voltage
High-level input voltage
Low-level Input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature range
LIMITS
Min
Max
4.5
5.5
0
V_CC
2.0
0.8
–32
64
0
10
–40
+85
UNIT
V
V
V
V
mA
mA
ns/V
°C
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
T_amb = +25°C
T_amb = –40°C
to +85°C
Min Typ Max Min Max
V_IK
Input clamp voltage
V_CC = 4.5V; I_IK = –18mA
–0.9 –1.2
–1.2
V_CC = 4.5V; I_OH = –3mA; V_I = V_IL or V_IH
2.5 2.9
2.5
V_OH High-level output voltage
V_CC = 5.0V; I_OH = –3mA; V_I = V_IL or V_IH
3.0 3.4
3.0
V_CC = 4.5V; I_OH = –32mA; V_I = V_IL or V_IH
2.0 2.4
2.0
V_OL Low-level output voltage
V_CC = 4.5V; I_OL = 64mA; V_I = V_IL or V_IH
0.42 0.55
0.55
I_I
Input leakage current
V_CC = 5.5V; V_I = GND or 5.5V
±0.01 ±1.0
±1.0
I_OFF Power-off leakage current
V_CC = 0.0V; V_O or V_I ≤ 4.5V
±5.0 ±100
±100
I_PU/I_PD
Power-up/down 3-State
output current
V_CC = 2.0V; V_O = 0.5V; V_I = GND or V_CC;
V_OE = V_CC
±5.0 ±50
±50
I_OZH 3-State output High current V_CC = 5.5V; V_O = 2.7V; V_I = V_IL or V_IH
5.0 50
50
I_OZL
3-State output Low current
V_CC = 5.5V; V_O = 0.5V; V_I = V_IL or V_IH
–5.0 –50
–50
I_CEX Output high leakage current V_CC = 5.5V; V_O = 5.5V; V_I = GND or V_CC
5.0 50
50
I_O
Output current¹
V_CC = 5.5V; V_O = 2.5V
–50 –70 –180 –50 –180
I_CCH
V_CC = 5.5V; Outputs High, V_I = GND or V_CC
65 250
250
I_CCL Quiescent supply current
V_CC = 5.5V; Outputs Low, V_I = GND or V_CC
48
60
60
I_CCZ
V_CC = 5.5V; Outputs 3-State;
V_I = GND or V_CC
65 250
250
∆I_CC
Additional supply current per Outputs enabled, one input at 3.4V, other
input pin²
inputs at V_CC or GND; V_CC = 5.5V
0.5 1.5
1.5
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
UNIT
V
V
V
V
V
µA
µA
µA
µA
µA
µA
mA
µA
mA
µA
mA
1998 Jan 16
4