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MB2377 Datasheet, PDF (4/8 Pages) NXP Semiconductors – Dual octal D-type flip-flop with enable
Philips Semiconductors Products
Dual octal D-type flip-flop with enable
Product specification
MB2377
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Tamb = +25°C
Tamb = –40°C to
+85°C
UNIT
MIN TYP MAX MIN MAX
VIK
Input clamp voltage
VCC = 4.5V; IIK = –18mA
–0.9 –1.2
VCC = 4.5V; IOH = –3mA; VI = VIL or VIH
2.5 2.9
2.5
VOH High-level output voltage
VCC = 5.0V; IOH = –3mA; VI = VIL or VIH
3.0 3.4
3.0
VCC = 4.5V; IOH = –32mA; VI = VIL or VIH
2.0 2.4
2.0
VOL Low-level output voltage
VCC = 4.5V; IOL = 64mA; VI = VIL or VIH
0.42 0.55
VRST Power-up output voltage3
VCC = 5.5V; IO = 1mA; VI = GND or VCC
0.13 0.55
II
IOFF
ICEX
IO
Input leakage current
Power-off leakage current
Output High leakage current
Output current1
VCC = 5.5V; VI = GND or 5.5V
VCC = 0.0V; VO or VI ≤ 4.5V
VCC = 5.5V; VO = 5.5V; VI = GND or VCC
VCC = 5.5V; VO = 2.5V
±0.01 ±1.0
±5.0 ±100
5.0 50
–50 –70 –180 –50
ICCH Quiescent supply current
VCC = 5.5V; Outputs High, VI = GND or VCC
120 250
ICCL
VCC = 5.5V; Outputs Low, VI = GND or VCC
48
60
∆ICC
Additional supply current
per input pin2
VCC = 5.5V; one input at 3.4V,
other inputs at VCC or GND
0.5 1.5
–1.2
V
V
V
V
0.55
V
0.55
V
±1.0 µA
±100 µA
50
µA
–180 mA
250
µA
60
mA
1.5 mA
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
August 23, 1993
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