MB2244 Datasheet, PDF (4/12 Pages) NXP Semiconductors – 16-bit buffer/line driver 3-State

Philips Semiconductors
16-bit buffer/line driver (3-State)
Product specification
MB2244
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
V_I
V_IH
V_IL
I_OH
I_OL
∆t/∆v
T_amb
DC supply voltage
Input voltage
High-level input voltage
Low-level input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature range
LIMITS
Min
Max
4.5
5.5
0
V_CC
2.0
0.8
–32
64
0
10
–40
+85
UNIT
V
V
V
V
mA
mA
ns/V
°C
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
T_amb = +25°C
T_amb = –40°C
to +85°C
UNIT
Min Typ Max Min Max
V_IK
V_OH
V_OL
I_I
I_OFF
I_PU/PD
I_OZH
I_OZL
I_CEX
I_O
I_CCH
I_CCL
I_CCZ
∆I_CC
Input clamp voltage
High-level output voltage
Low-level output voltage
Input leakage current
Power-off leakage current
Power-up/down 3-State
output current
3-State output High current
3-State output Low current
Output High leakage current
Output current¹
Quiescent supply current
Additional supply current per
input pin²
V_CC = 4.5V; I_IK = –18mA
V_CC = 4.5V; I_OH = –3mA; V_I = V_IL or V_IH
V_CC = 5.0V; I_OH = –3mA; V_I = V_IL or V_IH
V_CC = 4.5V; I_OH = –32mA; V_I = V_IL or V_IH
V_CC = 4.5V; I_OL = 64mA; V_I = V_IL or V_IH
V_CC = 5.5V; V_I = GND or 5.5V
V_CC = 0.0V; V_O or V_I ≤ 4.5V
V_CC = 2.0V; V_O = 0.5V; V_I = GND or V_CC;
V _OE = V_CC
V_CC = 5.5V; V_O = 2.7V; V_I = V_IL or V_IH
V_CC = 5.5V; V_O = 0.5V; V_I = V_IL or V_IH
V_CC = 5.5V; V_O = 5.5V; V_I = GND or V_CC
V_CC = 5.5V; V_O = 2.5V
V_CC = 5.5V; Outputs High, V_I = GND or V_CC
V_CC = 5.5V; Outputs Low, V_I = GND or V_CC
V_CC = 5.5V; Outputs 3-State;
V_I = GND or V_CC
Outputs enabled, one input at 3.4V, other
inputs at V_CC or GND; V_CC = 5.5V
–0.9 –1.2
–1.2 V
2.5 2.9
2.5
V
3.0 3.4
3.0
V
2.0 2.4
2.0
V
0.42 0.55
0.55 V
±0.01 ±1.0
±1.0 µA
±5.0 ±100
±100 µA
±5.0 ±50
±50 µA
5.0 50
50
µA
–5.0 –50
–50 µA
5.0 50
50
µA
–50 –100 –180 –50 –180 mA
50 100
100 µA
48
60
60 mA
50 100
100 µA
0.5 1.5
1.5 mA
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
1998 Jan 16
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