74F804 Datasheet, PDF (4/8 Pages) NXP Semiconductors – Hex 2-input NAND drivers

Philips Semiconductors
Hex 2-input NAND drivers
Product specification
74F804/1804
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
UNIT
V_CC
Supply voltage
V_IH
High–level input voltage
V_IL
Low–level input voltage
I_Ik
Input clamp current
I_OH
High–level output current
I_OL
Low–level output current
T_amb
Operating free air temperature range
LIMITS
T_A =
–40 to
MIN
NOM
MAX
+85°C
4.5
5.0
5.5
V
2.0
V
0.8
V
–18
mA
–48
mA
48
mA
0
+70
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
V_OH
High-level output voltage
V_CC = MIN, V_IL = MAX
±10%V_CC
2.0
V
V_IH = MIN, I_OH = MAX
±5%V_CC
2.0
V
V_OL
Low-level output voltage
V_CC = MIN, V_IL = MAX
±10%V_CC
0.38 0.55
V
V_IH = MIN, I_OL = MAX
±5%V_CC
0.38 0.55
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
I_I
Input current at maximum input voltage V_CC = MAX, V_I = 7.0V
-0.73 -1.2
V
100
µA
I_IH
High–level input current
V_CC = MAX, V_I = 2.7V
20
µA
I_IL
Low–level input current
I_O
Output current³
V_CC = MAX, V_I = 0.5V
V_CC = MAX
-20
µA
-60
-160 mA
I_CC
Supply current (total)
I_CCH V_CC = MAX
V_IN = GND
2.0
3.0
mA
I_CCL V_CC = MAX
V_IN = 4.5V
15
20
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. The output conditions have been chosen to produce a current that closely approximates one half of the true short–circuit output current, I_OS.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST
CONDITION
LIMITS
T_amb = +25°C
V_CC = +5.0V
C_L = 50pF,
R_L = 500Ω
T_amb = 0°C to +70°C
V_CC = +5.0V ± 10%
C_L = 50pF,
R_L = 500Ω
MIN TYP MAX
MIN
MAX
t_PLH
Propagation delay
t_PHL
Dna, Dnb to Qn
Waveform 1
1.0
2.0
4.0
1.0
3.0
4.5
1.0
1.0
4.0
5.0
t_sk(o)
Output skew^1,2
Waveform 2
1.5
1.5
NOTES:
1. [t_PN actual – t_PM actual] for any output compared to any other output where N and M are either LH or HL.
2. Skew times are valid only under same test conditions (temperature, V_CC, loading, etc.,).
UNIT
ns
ns
September 14, 1990
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