74F64 Datasheet, PDF (4/8 Pages) NXP Semiconductors – 4-2-3-2-input AND-OR-invert gate

Philips Semiconductors
4-2-3-2-input AND-OR-invert gate
Product specification
74F64
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
V_IH
V_IL
I_IK
I_OH
I_OL
T_amb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
LIMITS
MIN
NOM
MAX
4.5
5.0
5.5
2.0
0.8
–18
–1
20
0
+70
UNIT
V
V
V
mA
mA
mA
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN
TYP²
MAX
UNIT
V_OH
High-level output voltage
V_CC = MIN, V_IL = MAX ±10%V_CC
2.5
V
V_IH = MIN, I_OH = MAX
±5%V_CC
2.7
3.4
V
V_OL
Low-level output voltage
V_CC = MIN, V_IL = MAX
V_IH = MIN, I_OL = MAX
±10%V_CC
±5%V_CC
0.30
0.50
V
0.30
0.50
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
–0.73
–1.2
V
I_I
Input current at maximum input
voltage
V_CC = MAX, V_I = 7.0V
100
µA
I_IH
High-level input current
V_CC = MAX, V_I = 2.7V
20
µA
I_IL
Low-level input current
V_CC = MAX, V_I = 0.5V
–0.6
mA
I_OS
Short-circuit output current³
V_CC = MAX
–60
–150
mA
I_CC
Supply current (total)
I_CCH
I_CCL
V_CC = MAX
V_IN = GND
V_IN = 4.5V
1.9
2.8
mA
3.1
4.7
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1996 Mar 14
4