74F2373 Datasheet, PDF (4/10 Pages) NXP Semiconductors – Octal transparent latch with 30ohm equivalent output termination 3-State

Philips Semiconductors
Octal transparent latch with 30Ω equivalent output
termination (3-State)
Product specification
74F2373
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V_CC
V_IN
I_IN
V_OUT
Supply voltage
Input voltage
Input current
Voltage applied to output in high output state
–0.5 to +7.0
V
–0.5 to +7.0
V
–30 to +5
mA
-0.5 to V_CC
V
I_OUT
Current applied to output in low output state
24
mA
T_amb
T_stg
Operating free air temperature range
Storage temperature range
0 to +70
°C
–65 to +150
°C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
Supply voltage
V_IH
High-level input voltage
V_IL
Low-level input voltage
I_Ik
Input clamp current
I_OH
High-level output current
I_OL
Low-level output current
T_amb
Operating free air temperature range
* 12mA with reduced noise margin
LIMITS
UNIT
MIN
NOM
MAX
4.5
5.0
5.5
V
2.0
V
0.8
V
–18
mA
–3*
mA
5*
mA
0
+70
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
MIN TYP² MAX ^UNIT
V_CC = MIN, V_IL = MAX,
±10%V_{CC 2.4}
V
V_OH
High-level output voltage
V_IH = MIN, I_OH = –3mA
±5%V_{CC 2.7 3.4}
V
V_CC = MIN, V_IL = MAX,
±10%V_{CC 2.0}
V
V_IH = MIN, I_OH = –12mA
±5%V_{CC 2.0}
V
V_OL
V_IK
I_I
I_IH
I_IL
I_OZH
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Off-state output current, high-level voltage applied
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = –5mA
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = 12mA
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 7.0V
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_O = 2.7V
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
0.42 0.50 V
0.42 0.50 V
0.67
V
0.67
V
-0.73 -1.2 V
100 µA
20 µA
-0.6 mA
50 ^µA
I_OZL
Off-state output current, low-level voltage applied
V_CC = MAX, V_O = 0.5V
I_OS
Short-circuit output current³
V_CC = MAX
-50 ^µA
-60
-150 mA
I_CC
Supply current (total)
V_CC = MAX
35 60 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1999 Feb 01
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