74F2244 Datasheet, PDF (4/10 Pages) NXP Semiconductors – Octal buffer with 30ohm equivalent output termination 3-State

Philips Semiconductors
Octal buffer with 30Ω equivalent output termination
(3-State)
Product specification
74F2244
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
MIN TYP² MAX ^UNIT
V_OH
High-level output voltage
V_CC = MIN,
I_OH = –3mA ^±10%VC 2.5
V
V_IL = MAX,
C
±5%V_{CC 2.7 3.4}
V
V_IH = MIN
I_OH =
±10%V_{C 2.0}
V
–15mA
C
±5%V_{CC 2.0}
V
V_OL
V_IK
I_I
I_IH
I_IL
I_OZH
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High–level input current
Low–level input current
Off–state output current,
high–level voltage applied
V_CC = MIN,
V_IL = MAX,
I_OL = MAX
V_IH = MIN,
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 7.0V
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_O = 2.7V
±10%V_C
C
±5%V_CC
0.50 V
0.42 0.50 V
–0.73 -1.2 V
100 µA
20 µA
–0.2 mA
50 ^µA
I_OZL
Off–state output current,
low–level voltage applied
V_CC = MAX, V_O = 0.5V
–50 ^µA
I_OS
Short–circuit output current³
V_CC = MAX
-60
-150 mA
I_CCH
20 30 mA
I_CC
Supply current (total)
I_CCL V_CC = MAX
45 65 mA
I_CCZ
26 40 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
t_PLH
t_PHL
t_PZH
t_PZL
t_PHZ
t_PLZ
Propagation delay
Ian, Ibn to Yn
Output enable time
to high or low level
Output disable time
from high or low level
TEST
CONDITION
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
LIMITS
T_amb = +25°C
V_CC = +5.0V
C_L = 50pF, R_L = 500Ω
T_amb = 0°C to +70°C
V_CC = +5.0V ± 10%
C_L = 50pF, R_L = 500Ω
MIN TYP MAX
MIN
MAX
3.0
4.5
7.0
2.5
8.0
2.5
4.5
7.0
2.5
7.5
2.5
4.5
7.5
2.0
8.0
3.0
5.0
8.0
3.0
8.5
1.5
3.5
6.0
1.0
6.0
1.5
2.5
5.5
1.0
5.5
UNIT
ns
ns
ns
1994 Dec 05
4