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74ALVT162823 Datasheet, PDF (4/14 Pages) NXP Semiconductors – 18-bit bus-interface D-type flip-flop with reset and enable with 30ohm termination resistors (3-State)
Philips Semiconductors
2.5V/3.3V 18-bit bus-interface D-type flip-flop with reset
and enable with 30Ω termination resistors (3-State)
Product specification
74ALVT162823
FUNCTION TABLE
INPUTS
nOE
nMR
nCE
nCP
nDx
OUTPUTS
nQ0 – nQ8
L
L
X
X
X
L
L
H
L
↑
h
H
L
H
L
↑
l
L
L
H
H
↑
X
NC
H
X
X
X
X
Z
H=
h=
L=
l=
NC=
X=
Z=
↑=
↑=
High voltage level
High voltage level one set-up time prior to the Low-to-High clock transition
Low voltage level
Low voltage level one set-up time prior to the Low-to-High clock transition
No change
Don’t care
High impedance “off” state
Low to High clock transition
Not a Low-to-High clock transition
OPERATING MODE
Clear
Load and read data
Hold
High impedance
SCHEMATIC OF EACH OUTPUT
BUS HOLD CIRCUIT
VCC
VCC
VCC
27Ω
OUTPUT
27Ω
Data Input
To internal circuit
SW00007
SW00044
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
IIK
VI
IOK
VOUT
IOUT
DC supply voltage
DC input diode current
DC input voltage3
DC output diode current
DC output voltage3
DC output current
VI < 0
VO < 0
Output in Off or High state
Output in Low state
Output in High state
-0.5 to +4.6
V
-50
mA
-0.5 to +7.0
V
-50
mA
-0.5 to +7.0
V
128
mA
-64
Tstg
Storage temperature range
-65 to +150
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
1998 Aug 27
4