SA5223 Datasheet, PDF (3/12 Pages) NXP Semiconductors – Wide dynamic range AGC transimpedance amplifier 150MHz

Philips Semiconductors
Wide dynamic range AGC transimpedance amplifier(150MHz)
Product specification
SA5223
DC ELECTRICAL CHARACTERISTICS
Typical data and Min and Max limits apply at T_A = 25°C, and V_CC = +5V, unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
SA5223
Min Typ Max
V_IN
Input bias voltage
1.3
1.55
1.8
V_O± Output bias voltage
2.9
3.2
3.5
V_OS Output offset voltage (V_PIN6 - V_PIN7)
-200
80
+200
I_CC
Supply current
15
22
29
I_OMAX Output sink/source current
1.5
2
NOTE: Standard deviations are estimated from design simulations to represent manufacturing variations over the life of the product.
UNIT
V
V
mV
mA
mA
AC ELECTRICAL CHARACTERISTICS
Typical data and Min and Max limits apply at T_A = 25°C and V_CC = +5V, unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
SA5223
Min Typ Max
UNIT
R_T
Transresistance (differential output)
R_T
Transresistance
(single-ended output)
DC tested, R_L = ∞, I_IN = 0-1µA
DC tested, R_L = ∞, I_IN = 0-1µA
90
125 160
kΩ
45
62.5
80
kΩ
R_O
Output resistance
(differential output)
DC tested
140
Ω
R_O
f_3dB
R_IN
C_IN
C_INT
∆R/∆V
∆R/∆T
I_IN
Output resistance
(single-ended output)
Bandwidth (-3dB)
Input resistance
Input capacitance¹
Input capacitance including Miller multiplied
capacitance
Transresistance power supply sensitivity
Transresistance ambient temperature sensi-
tivity
RMS noise current spectral density (referred
to input)²
DC tested
Test Circuit 1
DC tested
V_CC1 = V_CC2 = 5 ±0.5V
∆T_A = T_{A MAX} - T_{A MIN}
Test Circuit 2, f = 10MHz
70
110 150
250
0.7
4.0
3
0.09
1.17
Ω
MHz
Ω
pF
pF
%/V
%/^oC
pAń ^ǸHz
Integrated RMS noise current over the band-
width (referred to input)
C_S = 0.1pF
I_T
C_S = 0.4pF
PSRR Power supply rejection ratio (change in V_OS)
PSRR Power supply rejection ratio³
Test circuit 2,
∆f = 50MHz
∆f = 100MHz
∆f = 150MHz
∆f = 50MHz
∆f = 100MHz
∆f = 150MHz
DC Tested, ∆V_CC = ±0.5V
f = 1.0MHz, Test Circuit 3
7
12
16
nA
8
13
18
–55
dB
–20
dB
V_OLMAX Maximum differential output AC voltage
I_i = 0–2mA peak AC
800
mV
dR_T
AGC loop time constant parameter⁴
dt
10µA to 20µA steps
1
dB/ms
I_INMAX
Maximum input amplitude for output duty
cycle of 50 ±5%
Test circuit 4
+2
mA
t_r, t_f Output rise and fall times
10 – 90%
2.2
ns
t_D
Group delay
f = 10MHz
2.2
ns
NOTES:
1. Does not include Miller-multiplied capacitance of input device.
2. Noise performance measured differential. Single-ended output noise is higher due to CM noise.
3. PSRR is output referenced and is circuit board layout dependent at higher frequencies. For best performance use a RF filter in V_CC line.
4. This implies that the SA5223 gain will change 1dB (10%) in the absence of data for 1ms (i.e., can handle bursty data without degrading Bit
Error Rate (BER) for 100,000 cycles at 100MHz).
1995 Oct 24
3