74F86 Datasheet, PDF (3/8 Pages) NXP Semiconductors – Quad 2-input exclusive-OR gate

Philips Semiconductors
Quad 2-input Exclusive-OR gate
Product specification
74F86
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
V_CC
V_IN
I_IN
V_OUT
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
I_OUT
T_amb
Current applied to output in Low output state
Operating free-air temperature range
Commercial range
Industrial range
T_stg
Storage temperature range
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
Supply voltage
V_IH
High-level input voltage
V_IL
Low-level input voltage
I_IK
Input clamp current
I_OH
High-level output current
I_OL
Low-level output current
T_amb
Operating free-air temperature range
MIN
4.5
2.0
Commercial range
0
Industrial range
–40
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to V_CC
40
0 to +70
–40 to +85
–65 to +150
LIMITS
NOM
5.0
MAX
5.5
0.8
–18
–1
20
+70
+85
UNIT
V
V
mA
V
mA
°C
°C
°C
UNIT
V
V
V
mA
mA
mA
°C
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
V_OH
High-level output voltage
V_OL
Low-level output voltage
V_CC = MIN, V_IL = MAX
±10%V_CC
2.5
V
V_IH = MIN, I_OH = MAX
±5%V_CC
2.7
3.4
V
V_CC = MIN, V_IL = MAX
±10%V_CC
0.30 0.50
V
V_IH = MIN, I_OL = MAX
±5%V_CC
0.30 0.50
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
-0.73 –1.2
V
I_I
Input current at maximum input voltage V_CC = MAX, V_I = 7.0V
100
µA
I_IH
High-level input current
V_CC = MAX, V_I = 2.7V
20
µA
I_IL
Low-level input current
V_CC = MAX, V_I = 0.5V
–0.6
mA
I_OS
Short-circuit output current³
V_CC = MAX
-60
–150
mA
I_CC
Supply current (total)
I_CCH V_CC = MAX
D0a = GND,
D0b = 4.5V
15
23
mA
I_CCL V_CC = MAX
V_IN = 4.5V
18
28
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
February 9, 1990
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