74ABT2952 Datasheet, PDF (3/12 Pages) NXP Semiconductors – Octal registered transceiver 3-State

Philips Semiconductors
Octal registered transceiver (3-State)
Product specification
74ABT2952
LOGIC SYMBOL
16 17 18 19 20 21 22 23
A0 A1 A2 A3 A4 A5 A6 A7
10
CPAB
11
CEAB
OEBA
15
14
CPBA
OEAB
9
13
CEBA
B0 B1 B2 B3 B4 B5 B6 B7
8765 432 1
SA00115
LOGIC SYMBOL (IEEE/IEC)
11
EN1
13
EN2
15
EN3
9
EN4
10
C5
14
C6
16
2, 3, 6 1, 4, 5
8
17
7
18
6
19
5
20
4
21
3
22
2
23
1
SA00116
FUNCTION TABLE for Register An or Bn
INPUTS
An or Bn CPXX
CEXX
INTERNAL
Q
OPERATING
MODE
X
X
H
NC
Hold data
L
↑
L
H
↑
L
L
H
Load data
H = High voltage level
L = Low voltage level
↑ = Low–to–High transition
X = Don’t care
XX = AB or BA
NC= No change
FUNCTION TABLE for Output Enable
INPUTS
OEXX
INTERNAL
Q
An or Bn
OUTPUTS
OPERATING
MODE
H
X
Z
Disable outputs
L
L
L
H
L
H
Enable outputs
H = High voltage level
L = Low voltage level
X = Don’t care
XX = AB or BA
Z = High impedance “off ” state
ABSOLUTE MAXIMUM RATINGS^{1, 2}
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V_CC
DC supply voltage
–0.5 to +7.0
V
I_IK
DC input diode current
V_I
DC input voltage³
V_I < 0
–18
mA
–1.2 to +7.0
V
I_OK
DC output diode current
V_O < 0
–50
mA
V_OUT
DC output voltage³
output in Off or High state
–0.5 to +5.5
V
I_OUT
DC output current
output in Low state
128
mA
T_stg
Storage temperature range
–65 to 150
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Feb 11
3