PCA3354C Datasheet, PDF (14/32 Pages) NXP Semiconductors – 8-bit microcontrollers with DTMF generator and 256 bytes EEPROM

Philips Semiconductors
8-bit microcontrollers with DTMF
generator and 256 bytes EEPROM
Product specification
PCA3354C; PCD3354A
7.1.2 EEPROM ADDRESS REGISTER (ADDR)
The EEPROM Address Register determines the EEPROM location to which an EEPROM access is directed.
As a whole, ADDR auto-increments after read and write cycles to EEPROM, but remains fixed after erase cycles. This
behaviour generates the correct ADDR contents for sequential read accesses and for sequential write or erase/write
accesses with intermediate page setup. Overflow of the 8-bit counter wraps around to zero.
Table 13 EEPROM Address Register (address 01H, access type R/W)
7
6
5
4
3
2
1
0
0
AD6
AD5
AD4
AD3
AD2
AD1
AD0
Table 14 Description of ADDR bits
BIT
7
6 to 2
1 to 0
SYMBOL
DESCRIPTION
−
This bit is set to a logic 0.
AD6 to AD2 AD2 to AD6 select one of 32 pages.
AD1 to AD0
AD1 and AD0 are irrelevant during erase and write cycles. For read accesses, AD0 and
AD1 indicate the byte location within an EEPROM page. During page setup, finally, AD0
and AD1 select EEPROM Latch 0 to 3 whereas AD2 to AD6 are irrelevant. If increment
mode (Table 12) is active during page setup, the subcounter consisting of AD0 and AD1
increments after every write to an EEPROM latch, thus enhancing access to sequential
EEPROM latches. Incrementing stops when EEPROM Latch 3 is reached, i.e. when
AD0 and AD1 are both a logic 1.
7.1.3 EEPROM DATA REGISTER (DATR)
Table 15 EEPROM Data Register (address 03H; access type R/W)
7
6
5
4
3
2
1
0
D7
D6
D5
D4
D3
D2
D1
D0
Table 16 Description of DATR bits
BIT
7 to 0
SYMBOL
D7 to D0
DESCRIPTION
The EEPROM Data Register (DATR) is only a conceptual entity. A read operation from
DATR, reads out the EEPROM byte addressed by ADDR. On the other hand, a write
operation to DATR, loads data into the EEPROM latch (see Fig.4) defined by bits AD0
and AD1 of ADDR.
7.1.4 EEPROM TEST REGISTER (TST)
The EEPROM Test register is used for testing purposes during device manufacture. It must not be accessed by the
device user.
1996 Dec 18
14