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| 74HC_HCT165_15 Datasheet, PDF (14/22 Pages) NXP Semiconductors – 8-bit parallel-in/serial out shift register | |||
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NXP Semiconductors
74HC165; 74HCT165
8-bit parallel-in/serial out shift register
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Test data is given in Table 9.
Deï¬nitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch
Fig 12. Test circuit for measuring switching times
Table 9. Test data
Type
Input
74HC165
74HCT165
VI
tr, tf
VCC
6 ns
3V
6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 kâ¦
1 kâ¦
S1 position
tPHL, tPLH
open
open
74HC_HCT165_3
Product data sheet
Rev. 03 â 14 March 2008
© NXP B.V. 2008. All rights reserved.
14 of 22
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