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MN673273 Datasheet, PDF (7/13 Pages) Panasonic Semiconductor – Signal-Processing LSI for Multimedia Camera
LSIs for Video Camera
MN673273
I Electrical Characteristics
1. Absoluste Maximum Ratings
Parameter
Symbol
Rating
Unit
Supply voltage(digital)
VDD
− 0.3 to +4.6
V
Supply voltage(analog)
AVDD
− 0.3 to +4.6
V
Input voltage
VI
− 0.3 to VDD+0.3
V
Output voltage
VO
− 0.3 to VDD+0.3
V
Average output
1 mA cell
IO
±3
mA
voltages
2 mA cell
±6
4 mA cell
±12
16 mA cell
±48
Operating temperature
Topr
−20 to +85
°C
Storage temperature
Tstg
−55 to +150
°C
Notes: 1. The absolute maximum ratings are limiting values under which the chip will not be destroyed. Operation is not
guaranteed within these ranges.
2. The VDD1, VDD2, VDD3, VDDTG, ADVDD1, and DAAVDD2 pins must always be held at the same voltage.
The VSS1, VSS2, VSS3, VSSTG, ADVSS1, and DAAVSS2 pins must always be held at the same voltage.
2. Operating Conditions VSS = AVSS = 0 V
Parameter
Symbol
Conditions
Min Typ Max Unit
Supply voltage(digital)
Supply voltage(analog)
Supply voltage(R, H1, H2)
VDD Digital system power supply
3.0 3.3 3.6 V
AVDD A/DandD/Aconverterpowersupply
3.0 3.3 3.6 V
VDDH Drive power supply for the R, H1, 3.0 3.3 3.6 V
and H2 output pins
Operating frequency
fCLK duty 50 %
9.5  20.0 MHz
3. DC Characteristics
VDDH = 3.0 V to 3.6 V, VDD = AVDD = 3.0 V to 3.6 V, VSS = AVSS = 0 V, Ta = −20 °C to +85 °C
Parameter
Symbol
Conditions
Min
Typ
Max Unit
Operating supply current
IDD
VDD = AVDD = VDDH = 3.6 V,

fCLK = 20.0 MHz, Ta = 25 °C
100
180 mA
Input pins1-1 TEST5, CLKRST, BLCSW, RESET, MINTEST, TESTSCAN
Input voltage High-level
Low-level
Input leakage current
VIH
VIL
ILI
VI = VDD or VSS
VDD × 0.8 
VDD
V
0
 VDD × 0.2
−5

5
µA
Input pins1-2 Pull-down Input pins TEST1 to TEST4, HSSFIX, MS, DO
Input voltage High-level
Low-level
Input leakage current
Pull-down resistor
VIH
VIL
ILIPD
RPD
VI = VSS
VI = VDD
VDD × 0.8 
VDD
V
0
 VDD × 0.2
−10

10
µA
10
30
90
kΩ
7