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XN09D61 Datasheet, PDF (1/5 Pages) Panasonic Semiconductor – Silicon PNP epitaxial planar type (Tr) / Silicon epitaxial planar type (SBD) | |||
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Composite Transistors
XN09D61
Silicon PNP epitaxial planar type (Tr)
Silicon epitaxial planar type (SBD)
For DC-DC converter
0.50+â00..0150
0.30+â00..0150
Unit: mm
0.16+â00..0160
â Features
⢠Two elements incorporated into one package (Tr + SBD)
⢠Reduction of the mounting area and assembly cost by one half
⢠Low collector-emitter saturation voltage VCE(sat)
â Basic Part Number
⢠2SA2046 + MA3ZD12
â Absolute Maximum Ratings Ta = 25°C
Parameter
Symbol Rating
Unit
Tr
Collector-base voltage
VCBO
â15
V
(Emitter open)
Collector-emitter voltage VCEO
â15
V
(Base open)
Emitter-base voltage
VEBO
â5
V
(Collector open)
Collector current
IC
â1.5
A
Peak collector current
ICP
â3
A
SBD Reverse voltage
VR
20
V
Repetitive peak reverse voltage VRRM
25
V
Forward current (Average) IF(AV)
700
mA
Non-repetitive peak
IFSM
2
A
forward surge current
Overall
Total power dissipation *
Junction temperature
Storage temperature
PT
600
mW
Tj
125
°C
Tstg â55 to +125 °C
Note) *: Measuring on ceramic substrate at 15 mm à 15 mm à 0.6 mm
65
4
1
2
3
(0.95) (0.95)
1.9±0.1
2.90+â00..0250
Display at No.1 lead
10°
1: Emitter
2: Base
3: Anode
4: Collector (Cathode)
5: Collector (Cathode)
6: Collector (Cathode)
Mini6-G1 Package
Marking Symbol: RA
Internal Connection
654
123
â Electrical Characteristics Ta = 25°C ± 3°C
⢠Tr
Parameter
Symbol
Conditions
Min Typ Max Unit
Collector-base voltage (Emitter open)
Collector-emitter voltage (Base open)
Emitter-base voltage (Collector open)
Collector-base cutoff current (Emitter open)
Forward current transfer ratio *
Collector-emitter saturation voltage *
VCBO
VCEO
VEBO
ICBO
hFE
VCE(sat)
IC = â10 µA, IE = 0
IC = â1 mA, IB = 0
IE = â10 µA, IC = 0
VCB = â10 V, IE = 0
VCE = â2 V, IC = â100 mA
IC = â750 mA, IB = â15 mA
IC = â1.5 A, IB = â50 mA
â15
V
â15
V
â5
V
â 0.1 µA
160
560

â90 â200 mV
â130
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *: Pulse measurement
Publication date: June 2003
SJJ00247BED
1
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