ECOS2EG101DX Datasheet, PDF (1/3 Pages) Panasonic Semiconductor – Snap-in Type

Aluminum Electrolytic Capacitors/ EX
Snap-in Type
Series: EX Type : TS
s Features VDE-0860 specification
Endurance : 105°C 2000 h
s Recommended Applications
Smoothing circuits, AC adaptor
Japan
s Specifications
Category temp. range
Rated W.V. Range
Nominal Cap. Range
Capacitance Tolerance
DC Leakage Current
Dissipation Factor
Frequency Correction
Factor for Ripple Current
Over voltage
characteristics
Endurance
Shelf Life
-25 to + 105°C
250 V .DC
3ÖCV
100 to 1200 µ F
±20 % (120Hz/+20°C)
(µA) max. after 5 minutes application of rated working voltage at +20°C
Capacitance(µF) V: W.V. (V.DC)
Please see the attached standard products list
Frequency (Hz) 50
60
100 120
500
1k 10k to
Correction Factor 0.93 0.95
0.99 1.00
1.05
1.08 1.15
After applying 360V.DC for 7 hours at following either temperature, capacitor shall not
short-circuit or vent shall not operate.
Condition (A) at 70°C
Condition (B) at 35°C
After 2000 hours application of DC voltage with specified ripple current (< rated DC working
voltage) at +105°C, the capacitor shall meet the following limits.
Capacitance change ±20 % of initial measured value
D.F.
< 200 % of initial specified value
DC leakage current < initial specified value
After storage for 1000 hours at +105±2 °C with no voltage applied and then being stabilized
at +20 °C, capacitors shall meet the limits specified in “Endurance”.(With voltage treatment)
s Dimensions in mm (not to scale)
Polarity bar
Vent
P.V.C. sleeve
(10.0) 2-φ2.0±0.1
10.0±0.1
L+2.0 max
h
(Standard terminal type)
0.8⁺-^00..21
h
2.0max
Recommended PWB piercing plan
0.8⁺-^00.2.1
h
2.0max
Terminal
(t= 0.8)
Top of spin
1.5 ± 0.2
Standard terminal type does not require
for cutting off process for terminals.
1.5±0.2
Top of spin
Design, Specifications are subject to change without notice. Ask factory for technical specifications before purchase and/or use.
Whenever a doubt about safety arises from this product, please inform us immediately for technical consulation without fail.
Mar. 2005
Ñ EE173 Ñ