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DMS935E2 Datasheet, PDF (1/5 Pages) Panasonic Semiconductor – Silicon NPN epitaxial planar type
This product complies with the RoHS Directive (EU 2002/95/EC).
DMS935E2
Silicon NPN epitaxial planar type (Tr)
Silicon epitaxial planar type (CCD load device)
For CCD output circuits
 Features
 Two elements incorporated into one package (Tr + CCD load device)
 High transition frequency fT
 Contributes to miniaturization of sets, reduction of component count.
 Eco-friendly Halogen-free package
 Basic Part Number
DSC2G03 + CCD load device (Individual)
 Packaging
Embossed type (Thermo-compression sealing): 8000 pcs / reel (standard)
 Absolute Maximum Ratings Ta = 25°C
Parameter
Symbol Rating Unit
Collector-base voltage (Emitter open) VCBO
30
V
Collector-emitter voltage (Base open) VCEO
20
V
Tr1
Emitter-base voltage (Collector open) VEBO
3
V
Collector current
IC
50
mA
CCD Limiting element voltage
load device Limiting element current
Vmax
40
V
Imax
10
mA
Total power dissipation *
PT
125
mW
Overall Junction temperature
Tj
150
°C
Storage temperature
Tstg –55 to +150 °C
Note) *: Measuring on substrate at 17 mm × 10 mm × 1 mm
 Package
 Code
SSMini6-F3-B
 Pin Name
1: Emitter
2: Base
3: Gate
4: Source
5: Drain
6: Collector
 Marking Symbol: X1
 Internal Connection
(C) (D) (S)
6
5
4
Tr
FET
1
2
3
(E) (B) (G)
 Electrical Characteristics Ta = 25°C±3°C
 Tr1
Parameter
Symbol
Conditions
Min Typ Max
Collector-base voltage (Emitter open)
VCBO IC = 100 µA, IE = 0
30
Emitter-base voltage (Collector open)
VEBO IE = 10 µA, IC = 0
3
Base-emitter voltage
VBE VCE = 10 V, IC = 2 mA
750
Forward current transfer ratio
hFE VCE = 10 V, IC = 2 mA
100
250
Transition frequency
fT VCE = 10 V, IC = 15 mA
1 300
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *: Pulse measurement
Unit
V
V
mV

MHz
 CCD load device
Parameter
Symbol
Conditions
Min Typ Max Unit
Pinchi off current
IP VDS = 8 V, VG = 0
5.0
7.0
mA
Output impedance
ZO VDS = 8 V, VG = 0
0.02
mW
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
Publication date: December 2010
Ver. BED
1