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2SC5829 Datasheet, PDF (1/3 Pages) Panasonic Semiconductor – For High Speed Switching
Transistors
2SC5829
Silicon NPN epitaxial planar type
For high speed switching
■ Features
• Allowing the small current and low voltage operation
• High transition frequency fT
• Suitable for high-density mounting and downsizing of the equip-
ment for Ultraminiature leadless package
0.6 mm × 1.0 mm (height 0.39 mm)
■ Absolute Maximum Ratings Ta = 25°C
Parameter
Symbol Rating
Unit
Collector-base voltage (Emitter open) VCBO
10
V
Collector-emitter voltage (Base open) VCEO
7
V
Emitter-base voltage (Collector open) VEBO
2
V
Collector current
IC
10
mA
Collector power dissipation
PC
50
mW
Junction temperature
Tj
150
°C
Storage temperature
Tstg −55 to +150 °C
Unit: mm
3
2
1
1.00±0.05
0.39+−00..0013
0.25±0.05
0.25±0.05
1
3
2
0.65±0.01
0.05±0.03
Marking Symbol: X
1: Base
2: Emitter
3: Collector
ML3-N2 Package
■ Electrical Characteristics Ta = 25°C ± 3°C
Parameter
Symbol
Conditions
Min Typ Max Unit
Collector-base cutoff current (Emitter open) ICBO VCB = 10 V, IE = 0
Emitter-base cutoff current (Collector open) IEBO VEB = 1.5 V, IC = 0
Forward current transfer ratio
hFE VCE = 1 V, IC = 1 mA
Transition frequency
fT
VCE = 1 V, IC = 1 mA, f = 0.8 GHz
Collector output capacitance
(Common base, input open circuited)
Cob VCB = 1 V, IE = 0, f = 1 MHz
1
µA
1
µA
100
200

4
GHz
0.4
pF
Forward transfer gain
Maximum unilateral power gain
Noise figure
S21e2
GUM
NF
VCE = 1 V, IC = 1 mA, f = 0.8 GHz
VCE = 1 V, IC = 1 mA, f = 0.8 GHz
VCE = 1 V, IC = 1 mA, f = 0.8 GHz
6
dB
15
dB
3.5
dB
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
Publication date: December 2002
SJC00287AED
1