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2SC3496 Datasheet, PDF (1/4 Pages) Panasonic Semiconductor – Silicon NPN triple diffusion planar type
Power Transistors
2SC3496, 2SC3496A
Silicon NPN triple diffusion planar type
For power switching
■ Features
• High-speed switching
• High collector-base voltage (Emitter open) VCBO
• Satisfactory linearity of forward current transfer ratio hFE
• N type package enabling direct soldering of the radiating fin to the
printed circuit board, etc. of small electronic equipment
■ Absolute Maximum Ratings TC = 25°C
Parameter
Symbol Rating
Unit
8.5±0.2
6.0±0.2
Unit: mm
3.4±0.3
1.0±0.1
0 to 0.4
0.8±0.1
2.54±0.3
1.4±0.1
R = 0.5
R = 0.5
1.0±0.1
0.4±0.1
5.08±0.5
123
(8.5)
(6.0) 1.3
Collector-base voltage 2SC3496 VCBO
900
V
(Emitter open)
2SC3496A
1 000
Collector-emitter voltage 2SC3496 VCES
900
V
(E-B short)
2SC3496A
1 000
Collector-emitter voltage 2SC3496 VCEO
800
V
(Base open)
2SC3496A
900
Emitter-base voltage (Collector open) VEBO
7
V
Base current
IB
0.3
A
Collector current
IC
1
A
Peak collector current
ICP
2
A
Collector power
PC
30
W
dissipation
Ta = 25°C
1.3
Junction temperature
Tj
150
°C
Storage temperature
Tstg −55 to +150 °C
(6.5)
1: Base
2: Collector
3: Emitter
N-G1 Package
Note) Self-supported type package is also prepared.
■ Electrical Characteristics TC = 25°C ± 3°C
Parameter
Symbol
Conditions
Min Typ Max Unit
Collector-emitter voltage
(Base open)
2SC3496 VCEO
2SC3496A
IC = 1 mA, IB = 0
800
V
900
Collector-base cutoff current 2SC3496 ICBO
(Emitter open)
2SC3496A
Emitter-base cutoff current (Collector open)
Forward current transfer ratio
Collector-emitter saturation voltage
Base-emitter saturation voltage
Transition frequency
Turn-on time
Storage time
Fall time
IEBO
hFE1
hFE2
VCE(sat)
VBE(sat)
fT
ton
tstg
tf
VCB = 900 V, IE = 0
VCB = 1 000 V, IE = 0
VEB = 7 V, IC = 0
VCE = 5 V, IC = 0.05 A
VCE = 5 V, IC = 0.5 A
IC = 0.2 A, IB = 0.04 A
IC = 0.2 A, IB = 0.04 A
VCE = 10 V, IC = 0.05 A, f = 1 MHz
IC = 0.2 A
IB1 = 0.04 A, IB2 = − 0.08 A
VCC = 250 V
50
µA
50
50
µA
6

3
1.5
V
1.0
V
4
MHz
1.0
µs
3.0
µs
1.0
µs
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
Publication date: March 2003
SJD00104AED
1