OP235TX_14 Datasheet, PDF (2/3 Pages) OPTEK Technologies – High Reliability Hermetic Infrared Emitting Diode

High Reliability Hermetic Infrared Emitting Diode
OP235, OP236 (TX, TXV)
Absolute Maximum Ratings (T_A = 25° C unless otherwise noted)
Storage Temperature Range
Operating Temperature Range
Reverse Voltage
Forward DC Current
Lead Soldering Temperature [1/16 inch (1.6 mm) from case for 5 seconds with soldering iron]
Power Dissipation
-65^o C to +150^o C
-55^o C to +125^o C
2.0 V
100 mA
260° C⁽¹⁾
200 mW⁽²⁾
Electrical Characteristics (T_A = 25° C unless otherwise noted)
SYMBOL
PARAMETER
E_E(APT)
Apertured Radiant Incidence
OP235 (TX, TXV)
OP236 (TX, TXV)
Forward Voltage
V_F
I_R
Reverse Current
λ_P
Wavelength at Peak Emission
β
Spectral Bandwidth between
Half Power Points
θ_HP Emission Angle at Half Power Points
MIN TYP MAX UNITS
TEST CONDITIONS
1.5 -
3.5 -
- mW/cm² I_F = 100 mA
-
1.1 - 2.0
1.3 - 2.2
0.9 - 1.8
-
- 100
- 890 -
I_F = 100 mA
V I_F = 100 mA, T_A = -55° C
I_F = 100 mA, T_A = 100° C
µA V_R= 2.0 V
nm I_F = 100 mA
-
50
-
nm I_F = 100 mA
-
18
- Degree I_F = 100 mA
Notes:
1. RMA flux is recommended. Duration can be extended to 10 seconds maximum when flow soldering.
2. Derate linearly 2.00 mW/° C above 25° C.
3. E_E(APT) is a measurement of the average radiant intensity within the cone formed by the measurement surface, a radius of
1.429” (36.30 mm) measured from the lens side of the tab to the sensing surface and a sensing surface of 0.250” (6.35 mm) in
diameter forming a 10° cone. E_E(APT) is not necessarily uniform within the measured area.
OPTEK reserves the right to make changes at any time in order to improve design and to supply the best product possible.
Issue A 03/09
Page 2 of 3
OPTEK Technology Inc. — 1645 Wallace Drive, Carrollton, Texas 75006
Phone: [phone] or [phone]
FAX: [phone] [e-mail] www.optekinc.com