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NCP716_16 Datasheet, PDF (7/18 Pages) ON Semiconductor – 80 mA Ultra-Low Iq, Wide Input Voltage Low Dropout Regulator
NCP716
Table 8. ELECTRICAL CHARACTERISTICS Voltage version 3.0 V
−40°C ≤ TJ ≤ 125°C; VIN = 4.0 V; IOUT = 1 mA, CIN = COUT = 1.0 mF, unless otherwise noted. Typical values are at TJ = +25°C. (Note 21)
Parameter
Test Conditions
Symbol Min Typ Max Unit
Operating Input Voltage
Output Voltage Accuracy
Turn−On Time
Undervoltage Lock−Out
Line Regulation
Load Regulation
Dropout voltage (Note 19)
Maximum Output Current
Ground current
Power Supply Rejection Ratio
Output Noise Voltage
0 < IOUT < 80 mA
VIN
4.0
24
V
4.3 V < VIN < 24 V, 0 < IOUT < 80 mA
VOUT
2.94
3.0
3.06
V
IOUT = 1 mA
tON
−
700
−
ms
VIN rising
UVLO
−
2.1
−
V
VOUT + 1 V ≤ VIN ≤ 24 V, IOUT = 1 mA
RegLINE
4
10
mV
IOUT = 0 mA to 80 mA
RegLOAD
10
30
mV
VDO = VIN – (VOUT(NOM) – 90 mV)
IOUT = 80 mA
VDO
580 mV
370
(Note 22)
IOUT
110
mA
0 < IOUT < 80 mA, −40 < TA < 85°C
IGND
3.2
4.2
mA
0 < IOUT < 80 mA, VIN = 24 V
5.8
mA
VIN = 4.3 V, VOUT = 3.3 V f = 100 kHz PSRR
58
dB
VPP = 200 mV modulation
IOUT = 1 mA, COUT = 10 mF
VOUT = 4.3 V, IOUT = 80 mA
VN
f = 200 Hz to 100 kHz
190
mVrms
Thermal Shutdown Temperature (Note 20) Temperature increasing from TJ = +25°C
TSD
155
°C
Thermal Shutdown Hysteresis (Note 20)
Temperature falling from TSD
TSDH
−
25
−
°C
19. Characterized when VOUT falls 90 mV below the regulated voltage and only for devices with VOUT = 3.0 V
20. Guaranteed by design and characterization.
21. Performance guaranteed over the indicated operating temperature range by design and/or characterization production tested at TJ = TA =
25°C. Low duty cycle pulse techniques are used during testing to maintain the junction temperature as close to ambient as possible.
22. Respect SOA
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