NLU1GT125_16 Datasheet, PDF (4/7 Pages) ON Semiconductor – Non-Inverting 3-State Buffer, TTL Level

NLU1GT125
SWITCHING WAVEFORMS
A
t_PLH
50%
50% V_CC
Y
V_CC
GND
t_PHL
Figure 3. Switching Waveforms
50%
OE
t_PZL t_PLZ
Y
50% V_CC
t_PZH t_PHZ
Y
50% V_CC
Figure 4.
V_CC
GND
HIGH
IMPEDANCE
V_OL + 0.3V
V_OH − 0.3V
HIGH
IMPEDANCE
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
C_L*
*Includes all probe and jig capacitance
Figure 5. Test Circuit
DEVICE
UNDER
TEST
TEST POINT
1 kW
OUTPUT
C_L*
CONNECT TO V_CC WHEN
TESTING t_PLZ AND t_PZL.
CONNECT TO GND
WHEN
TESTING t_PHZ AND t_PZH.
*Includes all probe and jig capacitance
Figure 6. Test Circuit
INPUT
Figure 7. Input Equivalent Circuit
ORDERING INFORMATION
Device
Package
Shipping^†
NLU1GT125MUTCG
UDFN6, 1.2 x 1.0, 0.4P
(Pb−Free)
3000 / Tape & Reel
NLU1GT125AMUTCG,
NLVU1GT125AMUTCG*
UDFN6, 1.45 x 1.0, 0.5P
(Pb−Free)
3000 / Tape & Reel
NLU1GT125CMUTCG
UDFN6, 1.0 x 1.0, 0.35P
(Pb−Free)
3000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP
Capable.
www.onsemi.com
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