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NBXDBB017_0910 Datasheet, PDF (4/8 Pages) ON Semiconductor – 3.3 V, 156.25 MHz / 312.5MHz LVPECL Clock Oscillator | |||
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NBXDBB017, NBXDBA017, NBXHBA017, NBXSBA017
Table 7. AC CHARACTERISTICS (VDD = 3.3 V ± 10%, GND = 0 V, TA = â40°C to +85°C) (Note 3)
Symbol
Characteristic
Conditions
Min.
Typ.
fCLKOUT
Output Clock Frequency
FSEL = HIGH
156.25
FSEL = LOW
312.5
Max.
Units
MHz
Df
Frequency Stability â NBXDBB017
0°C to +70°C
â NBXDBA017/NBXSBA017/NBXHBA017
â40°C to +85°C
(Note 4)
±20
ppm
±50
FNOISE
PhaseâNoise Performance
fCLKout = 156.25 MHz/312.5 MHz
(See Figures 3 and 4)
100 Hz of Carrier
1 kHz of Carrier
10 kHz of Carrier
â108/â102
â122/â115
â129/â122
dBc/Hz
dBc/Hz
dBc/Hz
100 kHz of Carrier
â129/â122
dBc/Hz
1 MHz of Carrier
â137/â131
dBc/Hz
10 MHz of Carrier
â161/â159
dBc/Hz
tjit(F)
tjitter
RMS Phase Jitter
CycleâtoâCycle, RMS
CycleâtoâCycle, PeakâtoâPeak
12 kHz to 20 MHz
1000 Cycles
1000 Cycles
0.4
0.9
ps
1
8
ps
7
30
ps
Period, RMS
10,000 Cycles
0.6
4
ps
Period, PeakâtoâPeak
10,000 Cycles
5
20
ps
tOE/OD
tDUTY_CYCLE
Output Enable/Disable Time
Output Clock Duty Cycle
(Measured at Cross Point)
200
ns
48
50
52
%
tR
Output Rise Time (20% and 80%)
250
400
ps
tF
Output Fall Time (80% and 20%)
250
400
ps
tstart
Startâup Time
Aging
1st Year
1
5
ms
3
ppm
Every Year After 1st
1
ppm
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
3. Measurement taken with outputs terminated with 50 ohm to VDDâ2 V. See Figure 5.
4. Parameter guarantees 10 years of aging. Includes initial stability at 25°C, shock, vibration, and first year aging.
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