NB100LVEP221_15 Datasheet, PDF (4/12 Pages) ON Semiconductor – Differential HSTL/ECL/PECL Clock Driver

NB100LVEP221
Table 3. ATTRIBUTES
Characteristics
Value
Internal Input Pulldown Resistor
75 kW
Internal Input Pullup Resistor
37.5 kW
ESD Protection
Human Body Model
Machine Model
Charged Device Model
> 2 kV
> 200 V
> 2 kV
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
Pb−Free Pkg
LQFP−52
QFN−52
Level 3
Level 2
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
533 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, refer to Application Note AND8003/D.
Table 4. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
V_CC
PECL Mode Power Supply
V_EE
NECL Mode Power Supply
V_I
PECL Mode Input Voltage
NECL Mode Input Voltage
I_out
Output Current
V_EE = 0 V
V_CC = 0 V
V_EE = 0 V
V_CC = 0 V
Continuous
Surge
V_I ≤ V_CC
V_I ≥ V_EE
6
V
−6
V
6
V
−6
V
50
mA
100
mA
I_BB
V_BB Sink/Source
T_A
Operating Temperature Range
T_stg
Storage Temperature Range
q_JA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
(See Application Information)
500 lfpm
LQFP−52
LQFP−52
± 0.5
−40 to +85
−65 to +150
35.6
30
mA
°C
°C
°C/W
°C/W
q_JC
Thermal Resistance (Junction−to−Case)
(See Application Information)
0 lfpm
500 lfpm
LQFP−52
LQFP−52
3.2
°C/W
6.4
°C/W
q_JA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
(Note )
500 lfpm
QFN−52
QFN−52
25
°C/W
19.6
°C/W
q_JC
Thermal Resistance (Junction−to−Case) (Note ) 2S2P
T_sol
Wave Solder
Pb
Pb−Free
QFN−52
21
°C/W
265
°C
265
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
www.onsemi.com
4