MC74VHCT541A_14 Datasheet, PDF (4/7 Pages) ON Semiconductor – Octal Bus Buffer

MC74VHCT541A
ORDERING INFORMATION
Device
MC74VHCT541ADWG
Package
SOIC−20WB
(Pb−Free)
Shipping^†
38 Units / Rail
MC74VHCT541ADWRG
SOIC−20WB
(Pb−Free)
1000 / Tape & Reel
MC74VHCT541ADTG
TSSOP−20
(Pb−Free)
75 Units / Rail
MC74VHCT541ADTRG
TSSOP−20
(Pb−Free)
2500 / Tape & Reel
NLV74VHCT541ADTRG*
TSSOP−20
(Pb−Free)
2500 / Tape & Reel
MC74VHCT541AMELG
SOEIAJ−20
(Pb−Free)
2000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP
Capable.
A
t_PLH
Y
1.5V
1.5V
3V
GND
t_PHL
V_OH
V_OL
Figure 3. Switching Waveform
OE1 or OE2
Y
Y
3V
1.5V
t_PZL
t_PLZ
1.5V
t_PZH
t_PHZ
1.5V
GND
HIGH
IMPEDANCE
V_OL +0.3V
V_OH -0.3V
HIGH
IMPEDANCE
Figure 4. Switching Waveform
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
C_L*
*Includes all probe and jig capacitance
Figure 5. Test Circuit
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kW
C_L*
CONNECT TO V_CC WHEN
TESTING t_PLZ AND t_PZL.
CONNECT TO GND WHEN
TESTING t_PHZ AND t_PZH.
*Includes all probe and jig capacitance
Figure 6. Test Circuit
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