MC74LVX126 Datasheet, PDF (4/5 Pages) ON Semiconductor – Quad Bus Buffe With 5V−Tolerant Inputs

MC74LVX126
NOISE CHARACTERISTICS (Input t_r = t_f = 3.0 ns, C_L = 50 pF, V_CC = 3.3 V, Measured in SOIC Package)
T_A = 25°C
Symbol
Characteristic
Typ
Max
Unit
V_OLP Quiet Output Maximum Dynamic V_OL
0.3
0.5
V
V_OLV Quiet Output Minimum Dynamic V_OL
−0.3
−0.5
V
V_IHD Minimum High Level Dynamic Input Voltage
2.0
V
V_ILD Maximum Low Level Dynamic Input Voltage
0.8
V
ORDERING INFORMATION
Device
Package
Shipping^†
MC74LVX126D
SOIC−14
55 Units / Rail
MC74LVX126M
SOEIAJ−14
50 Units / Rail
MC74LVX126MEL
SOEIAJ−14
2000 Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
SWITCHING WAVEFORMS
D
50%
t_PLH
O
50% V_CC
Figure 3.
V_CC
OE
GND
t_PHL
O
O
TEST CIRCUITS
50%
t_PZL
t_PLZ
50% V_CC
t_PZH t_PHZ
50% V_CC
Figure 4.
V_CC
GND
HIGH
IMPEDANCE
V_OL +0.3 V
V_OH −0.3 V
HIGH
IMPEDANCE
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
C_L*
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kW
C_L*
CONNECT TO V_CC WHEN
TESTING t_PLZ AND t_PZL.
CONNECT TO GND WHEN
TESTING t_PHZ AND t_PZH.
*Includes all probe and jig capacitance
Figure 5. Propagation Delay Test Circuit
*Includes all probe and jig capacitance
Figure 6. Three−State Test Circuit
http://onsemi.com
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