MC74LVX125_14 Datasheet, PDF (4/6 Pages) ON Semiconductor – Quad Bus Buffer

D
50%
t_PLH
O
50% V_CC
Figure 2.
MC74LVX125
SWITCHING WAVEFORMS
V_CC
GND
t_PHL
OE
50%
t_PZL
t_PLZ
O
50% V_CC
t_PZH
t_PHZ
O
50% V_CC
Figure 3.
V_CC
GND
HIGH
IMPEDANCE
V_OL +0.3V
V_OH -0.3V
HIGH
IMPEDANCE
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
C_L*
TEST CIRCUITS
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kW
C_L*
CONNECT TO V_CC WHEN
TESTING t_PLZ AND t_PZL.
CONNECT TO GND WHEN
TESTING t_PHZ AND t_PZH.
*Includes all probe and jig capacitance
Figure 4. Propagation Delay Test Circuit
*Includes all probe and jig capacitance
Figure 5. Three−State Test Circuit
ORDERING INFORMATION
Device
Package
Shipping^†
MC74LVX125DG
SOIC−14 NB
(Pb−Free)
55 Units / Rail
MC74LVX125DR2G
SOIC−14 NB
(Pb−Free)
2500 Tape & Reel
MC74LVX125DTG
TSSOP−14
(Pb−Free)
96 Units / Rail
MC74LVX125DTR2G
TSSOP−14
(Pb−Free)
2500 Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
http://onsemi.com
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