MC74HC1G00 Datasheet, PDF (4/6 Pages) ON Semiconductor – Single 2-Input NAND Gate

MC74HC1G00
INPUT
A or B 90%
50%
10%
t_f
t_PLH
OUTPUT Y
90%
50%
10%
t_TLH
t_r
V_CC
GND
t_PHL
t_THL
Figure 4. Switching Waveforms
V_CC
INPUT
OUTPUT
C_L*
*Includes all probe and jig capacitance.
A 1−MHz square input wave is recommended for
propagation delay tests.
Figure 5. Test Circuit
DEVICE ORDERING INFORMATION
Device Nomenclature
Device Order
Number
Logic
Temp
Tape and
Circuit Range
Device Package Reel
Indicator Identifier Technology Function Suffix Suffix
Package
Type
Tape and
Reel Size^†
MC74HC1G00DFT1
MC
74
HC1G
00
DF
T1
SC70−5/SC−88A/ 178 mm (7 in)
SOT−353
3000 Unit
MC74HC1G00DFT1G
MC
74
HC1G
00
DF
T1
SC70−5/SC−88A/ 178 mm (7 in)
SOT−353
3000 Unit
(Pb−Free)
MC74HC1G00DFT2
MC
74
HC1G
00
DF
T2
SC70−5/SC−88A/ 178 mm (7 in)
SOT−353
3000 Unit
MC74HC1G00DFT2G
MC
74
HC1G
00
DF
T2
SC70−5/SC−88A/ 178 mm (7 in)
SOT−353
3000 Unit
(Pb−Free)
MC74HC1G00DTT1
MC
74
HC1G
00
DT
T1
SOT23−5/TSOP−5/ 178 mm (7 in)
SC59−5
3000 Unit
MC74HC1G00DTT1G
MC
74
HC1G
00
DT
T1
SOT23−5/TSOP−5/ 178 mm (7 in)
SC59−5
3000 Unit
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
http://onsemi.com
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