English
Language : 

MC74AC240 Datasheet, PDF (4/8 Pages) ON Semiconductor – OCTAL BUFFER/LINE DRIVER WITH 3-STATE OUTPUTS
MC74AC240, MC74ACT240
AC CHARACTERISTICS (For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
74AC
74AC
Symbol
Parameter
VCC*
(V)
TA = +25°C
CL = 50 pF
TA = −40°C
to +85°C
CL = 50 pF
Unit
Fig.
No.
Min Typ Max Min Max
Propagation Delay
tPLH
Data to Output
Propagation Delay
tPHL
Data to Output
tPZH
Output Enable Time
tPZL
Output Enable Time
tPHZ
Output Disable Time
tPLZ
Output Disable Time
* Voltage Range 3.3 V is 3.3 V ±0.3 V.
Voltage Range 5.0 V is 5.0 V ±0.5 V.
DC CHARACTERISTICS
3.3 1.5 6.0 8.0 1.0 9.0
5.0 1.5 4.5 6.5 1.0 7.0
ns
3−5
3.3 1.5 5.5 8.0 1.0 8.5
5.0 1.5 4.5 6.0 1.0 6.5
ns
3−5
3.3 1.5 6.0 10.5 1.0 11.0
5.0 1.5 5.0 7.0 1.0 8.0
ns
3−7
3.3 1.5 7.0 10.0 1.0 11.0
5.0 1.5 5.5 8.0 1.0 8.5
ns
3−8
3.3 1.5 7.0 10.0 1.0 10.5
5.0 1.5 6.5 9.0 1.0 9.5
ns
3−7
3.3 1.5 7.5 10.5 1.0 11.5
5.0 1.5 6.5 9.0 1.0 9.5
ns
3−8
Symbol
Parameter
74ACT
74ACT
VCC
(V)
TA = +25°C
TA = −40°C to +85°C
Unit
Typ
Guaranteed Limits
Conditions
VIH
Minimum High Level
4.5
1.5
2.0
2.0
Input Voltage
5.5
1.5
2.0
2.0
VIL
Maximum Low Level
4.5
1.5
0.8
0.8
Input Voltage
5.5
1.5
0.8
0.8
VOH
Minimum High Level
4.5
4.49
4.4
4.4
Output Voltage
5.5
5.49
5.4
5.4
V
VOUT = 0.1 V
or VCC − 0.1 V
V
VOUT = 0.1 V
or VCC − 0.1 V
V
IOUT = −50 mA
4.5
−
3.86
3.76
5.5
−
4.86
4.76
*VIN = VIL or VIH
V
−24 mA
IOH
−24 mA
VOL
Maximum Low Level
4.5
0.001
0.1
0.1
Output Voltage
5.5
0.001
0.1
0.1
V
IOUT = 50 mA
4.5
−
0.36
0.44
5.5
−
0.36
0.44
*VIN = VIL or VIH
V
IOL
24 mA
24 mA
IIN
Maximum Input
Leakage Current
5.5
−
±0.1
±1.0
mA
VI = VCC, GND
∆ICCT
Additional Max. ICC/Input 5.5
0.6
−
1.5
IOZ
Maximum
3−State
Current
5.5
−
±0.5
±5.0
IOLD
†Minimum Dynamic
5.5
−
−
75
Output Current
IOHD
5.5
−
−
−75
mA
VI = VCC − 2.1 V
VI (OE) = VIL, VIH
mA
VI = VCC, GND
VO = VCC, GND
mA
VOLD = 1.65 V Max
mA
VOHD = 3.85 V Min
ICC
Maximum Quiescent
Supply Current
5.5
−
8.0
80
mA
VIN = VCC or GND
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
http://onsemi.com
4