KAI-01150 Datasheet, PDF (34/36 Pages) ON Semiconductor – Interline CCD Image Sensor

CLCC Cover Glass
KAI−01150
Notes:
1. Dust/Scratch Count – 12 micron maximum
2. Units: millimeter
3. Reflectance Specification
a. 420 nm to 435 nm < 2.0%
b. 435 nm to 630 nm < 0.8%
c. 630 nm to 680 nm < 2.0%
Figure 32. CLCC Cover Glass
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