MC74LVX139_14 Datasheet, PDF (3/7 Pages) ON Semiconductor – Dual 2-to-4 Decoder/ Demultiplexer

MC74LVX139
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V_CC
V_IN
V_OUT
I_IK
I_OK
I_OUT
I_CC
P_D
Positive DC Supply Voltage
Digital Input Voltage
DC Output Voltage
Input Diode Current
Output Diode Current
DC Output Current, per Pin
DC Supply Current, V_CC and GND Pins
Power Dissipation in Still Air
−0.5 to +7.0
V
−0.5 to +7.0
V
−0.5 to V_CC +0.5
V
−20
mA
±20
mA
±25
mA
±75
mA
SOIC Package
200
mW
TSSOP
180
T_STG
V_ESD
Storage Temperature Range
ESD Withstand Voltage
−65 to +150
°C
Human Body Model (Note 1)
> 2000
V
Machine Model (Note 2)
> 200
Charged Device Model (Note 3)
> 2000
I_LATCHUP Latchup Performance
Above V_CC and Below GND at 125°C (Note 4)
±300
mA
q_JA
Thermal Resistance, Junction−to−Ambient
SOIC Package
143
TSSOP
164
°C/W
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Tested to EIA/JESD22−A114−A
2. Tested to EIA/JESD22−A115−A
3. Tested to JESD22−C101−A
4. Tested to EIA/JESD78
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min
Max
Unit
V_CC
V_IN
V_OUT
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Output in 3−State
High or Low State
2.0
3.6
V
0
5.5
V
0
V_CC
V
T_A Operating Temperature Range, all Package Types
−40
85
°C
t_r, t_f Input Rise or Fall Time
V_CC = 5.0 V ± 0.5 V
0
100
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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