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MC74LCX244_16 Datasheet, PDF (3/10 Pages) ON Semiconductor – Low-Voltage CMOS Octal Buffer
MC74LCX244
MAXIMUM RATINGS
Symbol
Parameter
Value
Condition
Units
VCC
DC Supply Voltage
VI
DC Input Voltage
VO
DC Output Voltage
IIK
DC Input Diode Current
IOK
DC Output Diode Current
IO
ICC
IGND
TSTG
TL
DC Output Source/Sink Current
DC Supply Current Per Supply Pin
DC Ground Current Per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case
for 10 Seconds
−0.5 to +7.0
−0.5 ≤ VI ≤ +7.0
−0.5 ≤ VO ≤ +7.0
−0.5 ≤ VO ≤ VCC + 0.5
−50
−50
+50
±50
±100
±100
−65 to +150
TL = 260
V
V
Output in 3−State
V
Output in HIGH or LOW State (Note 1)
V
VI < GND
mA
VO < GND
mA
VO > VCC
mA
mA
mA
mA
°C
°C
TJ
Junction Temperature Under Bias
TJ = 150
°C
qJA
Thermal Resistance (Note 2)
qJA = 140
°C/W
MSL
Moisture Sensitivity
Level 1
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Units
VCC
Supply Voltage
Operating
Data Retention Only
V
2.0
2.5, 3.3
5.5
1.5
2.5, 3.3
5.5
VI
Input Voltage
VO
Output Voltage
HIGH or LOW State
3−State
0
5.5
V
V
0
VCC
0
5.5
IOH
HIGH Level Output Current
VCC = 3.0 V − 3.6 V
VCC = 2.7 V − 3.0 V
mA
−24
−12
IOL
LOW Level Output Current
VCC = 3.0 V − 3.6 V
VCC = 2.7 V − 3.0 V
mA
24
12
TA
Operating Free−Air Temperature
−55
+125
°C
Dt/DV Input Transition Rise or Fall Rate, VIN from 0.8 V to 2.0 V, VCC = 3.0 V
0
10
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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