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MC10EP101_06 Datasheet, PDF (3/9 Pages) ON Semiconductor – 3.3V / 5V ECL Quad 4−Input OR/NOR | |||
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MC10EP101, MC100EP101
Table 3. ATTRIBUTES
Characteristics
Internal Input Pulldown Resistor
Internal Input Pullup Resistor
ESD Protection
Human Body Model
Machine Model
Charged Device Model
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
LQFPâ32
QFNâ32
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Value
75 kW
N/A
> 4 kV
> 100 V
> 2 kV
Pb Pkg
PbâFree Pkg
Level 2
Level 2
Level 1
ULâ94 Vâ0 @ 0.125 in
173 Devices
Table 4. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE
NECL Mode Power Supply
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
Iout
Output Current
VEE = 0 V
VCC = 0 V
VEE = 0 V
VCC = 0 V
Continuous
Surge
VI ⤠VCC
VI ⤠VEE
6
V
â6
V
6
V
â6
V
50
mA
100
mA
IBB
VBB Sink/Source
± 0.5
mA
TA
Operating Temperature Range
â40 to +85
°C
Tstg
Storage Temperature Range
qJA
Thermal Resistance (JunctionâtoâAmbient) 0 lfpm
500 lfpm
32 LQFP
32 LQFP
â65 to +150
80
55
°C
°C/W
°C/W
qJC
Thermal Resistance (JunctionâtoâCase) Standard
qJA
Thermal Resistance (JunctionâtoâAmbient) 0 lfpm
500 lfpm
32 LQFP
QFNâ32
QFNâ32
12 to 17
31
27
°C/W
°C/W
°C/W
qJC
Thermal Resistance (JunctionâtoâCase) 2S2P
Tsol
Wave Solder
Pb
PbâFree
QFNâ32
12
°C/W
265
°C
265
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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