LP2951ACD-33R2G Datasheet, PDF (3/22 Pages) ON Semiconductor – 100 mA, Low Power Low Dropout Voltage Regulator

LP2950, LP2951, NCV2951
MAXIMUM RATINGS (T_A = 25C, unless otherwise noted.)
Rating
Symbol
Value
Unit
Input Voltage
V_CC
30
Vdc
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ Peak Transient Input Voltage (t < 20 ms)
Power Dissipation and Thermal Characteristics
V_CC
32
Vdc
Maximum Power Dissipation
P_D
Internally Limited
W
Case 751(SOIC−8) D Suffix
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
R_qJA
R_qJC
180
C/W
45
C/W
Case 369A (DPAK) DT Suffix (Note 1)
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
R_qJA
R_qJC
92
C/W
6.0
C/W
Case 29 (TO−226AA/TO−92) Z Suffix
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
R_qJA
R_qJC
160
C/W
83
C/W
Case 626 N Suffix
Thermal Resistance, Junction−to−Ambient
R_qJA
105
C/W
Case 846A (Micro8) DM Suffix
Thermal Resistance, Junction−to−Ambient
R_qJA
240
C/W
Feedback Input Voltage
V_fb
−1.5 to +30
Vdc
Shutdown Input Voltage
V_sd
−0.3 to +30
Vdc
Error Comparator Output Voltage
V_err
−0.3 to +30
Vdc
Operating Ambient Temperature Range
T_A
−40 to +125
C
Maximum Die Junction Temperature Range
T_J
+150
C
Storage Temperature Range
T_stg
−65 to +150
C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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