CAT93C46B Datasheet, PDF (3/14 Pages) ON Semiconductor – Microwire Serial EEPROM

CAT93C46B
Table 5. A.C. CHARACTERISTICS
(V_CC = +1.8 V to +5.5 V, T_A = −40°C to +125°C, V_CC = +1.65 V to +5.5 V, T_A = −20°C to +85°C unless otherwise specified.)
V_CC < 3.3 V
V_CC > 3.3 V
T_A = −405C to +855C
Symbol
Parameter
Min
Max
Min
Max
t_CSS
CS Setup Time
50
50
t_CSH
t_DIS
t_DIH
t_PD1
t_PD0
t_HZ (Note 5)
t_EW
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High−Z
Program / Erase Cycle Time
0
0
100
50
100
50
0.25
0.1
0.25
0.1
100
100
WRITE, ERASE
3
3
WRAL, ERAL
5
5
t_CSMIN
Minimum CS Low Time
0.25
0.1
t_SKHI
Minimum SK High Time
0.25
0.1
t_SKLOW
Minimum SK Low Time
0.25
0.1
t_SV
Output Delay to Status Valid
0.25
SK_MAX
Maximum Clock Frequency
DC
2000
DC
5. This parameter is tested initially and after a design or process change that affects the parameter.
0.1
4000
Units
ns
ns
ns
ns
ms
ms
ns
ms
ms
ms
ms
ms
kHz
Table 6. POWER−UP TIMING (Notes 6 and 7)
Symbol
Parameter
Max
Units
t_PUR
Power−up to Read Operation
0.1
ms
t_PUW
Power−up to Write Operation
0.1
ms
6. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
7. t_PUR and t_PUW are the delays required from the time V_CC is stable until the specified operation can be initiated.
Table 7. A.C. TEST CONDITIONS
Input Rise and Fall Times
Input Pulse Voltages
Timing Reference Voltages
Input Pulse Voltages
Timing Reference Voltages
Output Load
v 50 ns
0.4 V to 2.4 V
4.5 V v V_CC v 5.5 V
0.8 V, 2.0 V
4.5 V v V_CC v 5.5 V
0.2 V_CC to 0.7 V_CC
1.65 V v V_CC v 4.5 V
0.5 V_CC
1.65 V v V_CC v 4.5 V
Current Source I_OLmax/I_OHmax; C_L = 100 pF
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