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CAT871 Datasheet, PDF (3/9 Pages) ON Semiconductor – Dual Input Reset Generator | |||
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CAT871, CAT872
Table 3. RECOMMENDED OPERATING CONDITIONS
Rating
Symbol
Min
Input Voltage; VDD
Input Voltage; MR1, MR2
Output Current; RESET
VDD
VIN
IOUT
1.65
0
0
Ambient Temperature
TA
â40
Max
Unit
5.5
V
VDD
V
3
mA
85
°C
Table 4. ELECTRICAL OPERATING CHARACTERISTICS
(VDD = 1.65 V to 5.5 V. For typical values TA = 25°C, for min/max values TA = â40°C to +85°C unless otherwise noted.)
Parameter
Test Conditions
Symbol
Min
Typ
Max
POWER
VDD Supply Voltage
Quiescent Supply Current
Operating Supply Current
VDD
MR1 = MR2 = VDD.
IDD
MR1 = MR2 = 0 V
Measured during setup period. Measurement
includes current through internal 200 kΩ
pullâup resistor on MR2
1.65
5.5
10
1000
50
LOGIC INPUTS AND OUTPUTS
Input Voltage; HIGH
Input Voltage; LOW
Hysteresis
Input Current
Input Current
MR1, MR2
MR1, MR2
MR1 = 0 V; VDD = 5 V (no internal pullâup)
MR2 = 0 V; VDD = 5 V
(internal 200 kW pullâup resistor)
VIH
VIL
VHYS
IPU
IPU
0.7 x VDD
0.25xVDD
â
250
50
300
25
Output Voltage; HIGH
Output Voltage; LOW
TIMING
External 10 kW pullâup resistor to VDD
ISINK = 3 mA, VDD = 1.8 V
VOH
VDD â 0.1
VOL
0.1
0.4
Timeout
CAT87xâ05
CAT87xâ10
tLOW_DELAY
0.41
0.82
0.50
1.00
0.59
1.18
CAT87xâ15
1.23
1.50
1.77
CAT87xâ20
1.64
2.00
2.36
CAT87xâ25
2.05
2.50
2.95
CAT87xâ30
2.46
3.00
3.54
CAT87xâ40
3.28
4.00
4.72
CAT87xâ50
4.1
5.00
5.9
Reset Output Pulse Width
CAT871
CAT872
tR
1.8
2.2
2.6
57
70
83
TEST MODE (at TA = 25°C) (Note 3)
Start TEST window
tST
Test Mode delay
MR1=0 V, MR2â8 cycles, delay measured
tD
after 8th rising edge of the MR2 clock pulse
35
250
Test Mode Clock Frequency Clock applied to MR2
ftm
1
MR2 Test mode clock setup Measured from MR1 falling edge to first
tP
1
time
falling edge of MR2
MR2 Input Voltage; LOW
MR2, Test mode operation
MR2 Pulse Width
3. âTest Modeâ parameters are not tested in production.
VIL_TM
tpw
0.2xVDD
500
Unit
V
nA
mA
V
V
mV
nA
mA
V
V
s
s
s
s
s
s
s
s
ms
ms
ms
MHz
ms
V
ns
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