NOIP1SN5000A_16 Datasheet, PDF (20/75 Pages) ON Semiconductor – PYTHON 5.0/2.0 MegaPixels Global Shutter CMOS Image Sensors

NOIP1SN5000A
Sensor reconfiguration
During the standby, idle, or running state several sensor
parameters can be reconfigured.
• Frame Rate and Exposure Time: Frame rate and
exposure time changes can occur during standby, idle,
and running states by modifying registers 199 to 203.
Refer to page 30−32 for more information.
• Signal Path Gain: Signal path gain changes can occur
during standby, idle, and running states by modifying
registers 204/205. Refer to page 37 for more
information.
• Windowing: Changes with respect to windowing can
occur during standby, idle, and running states. Refer to
Multiple Window Readout on page 28 for more
information.
• Subsampling: Changes of the subsampling mode can
occur during standby, idle, and running states by
modifying register 192. Refer to Subsampling on
page 29 for more information.
• Shutter Mode: The shutter mode can only be changed
during standby or idle mode by modifying register 192.
Reconfiguring the shutter mode during running state is
not supported.
Sensor Configuration
This device contains multiple configuration registers.
Some of these registers can only be configured while the
sensor is not acquiring images (while register 192[0] = 0),
while others can be configured while the sensor is acquiring
images. For the latter category of registers, it is possible to
distinguish the register set that can cause corrupted images
(limited number of images containing visible artifacts) from
the set of registers that are not causing corrupted images.
These three categories are described here.
Static Readout Parameters
Some registers are only modified when the sensor is not
acquiring images. reconfiguration of these registers while
images are acquired can cause corrupted frames or even
interrupt the image acquisition. Therefore, it is
recommended to modify these static configurations while
the sequencer is disabled (register 192[0] = 0). The registers
shown in Table 15 should not be reconfigured during image
acquisition. A specific configuration sequence applies for
these registers. Refer to the operation flow and startup
description.
Table 15. STATIC READOUT PARAMETERS
Group
Addresses
Description
Clock generator
32
Configure according to recommendation
Image core
40
Configure according to recommendation
AFE
48
Configure according to recommendation
Bias
64–71
Configure according to recommendation
Charge Pump
72
Configure according to recommendation
LVDS
112
Configure according to recommendation
Sequencer mode selection
192 [6:1]
Operation modes are: • triggered_mode
• slave_mode
All reserved registers
Keep reserved registers to their default state, unless otherwise described in the recommendation
Dynamic Configuration Potentially Causing Image
Artifacts
The category of registers as shown in Table 16 consists of
configurations that do not interrupt the image acquisition
process, but may lead to one or more corrupted images
during and after the reconfiguration. A corrupted image is an
image containing visible artifacts. A typical example of a
corrupted image is an image which is not uniformly
exposed.
The effect is transient in nature and the new configuration
is applied after the transient effect.
Table 16. DYNAMIC CONFIGURATION POTENTIALLY CAUSING IMAGE ARTIFACTS
Group
Addresses
Description
Black level configuration
128–129
197[12:8]
Reconfiguration of these registers may have an impact on the black−level
calibration algorithm. The effect is a transient number of images with incorrect black level com-
pensation.
Sync codes
129[13]
116–126
Incorrect sync codes may be generated during the frame in which these registers are modified.
Datablock test configurations
144, 146–150
Modification of these registers may generate incorrect test patterns during
a transient frame.
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