NLV17SZ86 Datasheet, PDF (2/5 Pages) ON Semiconductor – Single 2-Input OR Gate

PIN ASSIGNMENT
(SOT−353/SC70−5/SC−88A)
Pin
Function
1
IN B
2
IN A
3
GND
4
OUT Y
5
V_CC
NLV17SZ86
FUNCTION TABLE
Input
A
B
L
L
L
H
H
L
H
H
Output
Y
L
H
H
L
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V_CC
DC Supply Voltage
V_I
DC Input Voltage
V_O
DC Output Voltage
−0.5 to )7.0
V
−0.5 V v V_I v +7.0 V
V
Output in High or Low State (Note 1)
−0.5 V to + 7.0
V
Power−Down Mode
I_IK
I_OK
I_O
I_CC
I_GND
T_STG
T_L
T_J
q_JA
P_D
MSL
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature under Bias
Thermal Resistance
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
V_I < GND
V_OUT < GND
(Note 2)
−50
−50
±50
±100
±100
−65 to +150
260
)150
350
150
Level 1
mA
mA
mA
mA
mA
°C
°C
°C
°C/W
mW
F_R
ESD
Flammability Rating
ESD Classification
Oxygen Index: 28 to 34
Human Body Model (Note 4)
Machine Model (Note 5)
Charge Device Model (Note 6)
UL 94 V−0 @ 0.125 in
Class 1B
Class B
N/A
I_LATCHUP Latchup Performance Above V_CC and Below GND at 85°C (Note 3)
±500
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. I_O absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
3. Tested to EIA/JESD78
4. Tested to EIA/JESD22−A114−A, rated to EIA/JESD22−A114−B.
5. Tested to EIA/JESD22−A115−A, rated to EIA/JESD22−A115−B.
6. Tested to JESD22−C101−A.
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