MC74VHCT50A_07 Datasheet, PDF (2/7 Pages) ON Semiconductor – Noninverting Buffer / CMOS Logic Level Shifter with LSTTL−Compatible Inputs

MC74VHCT50A
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V_CC
V_IN
V_OUT
I_IK
I_OK
I_O
I_CC
I_GND
T_STG
T_L
T_J
q_JA
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Output in HIGH or LOW State (Note 1)
DC Input Diode Current
DC Output Diode Current
DC Output Source/Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature under Bias
Thermal Resistance
SOIC
TSSOP
*0.5 to )7.0
*0.5 v V_I v )7.0
*0.5 v V_O v )7.0
*20
$20
$25
$50
$50
*65 to )150
260
)150
125
170
V
V
V
mA
mA
mA
mA
mA
_C
_C
_C
_C/W
P_D
Power Dissipation in Still Air
mW
SOIC
500
TSSOP
450
V_ESD
ESD Withstand Voltage
Human Body Model (Note 2)
> 2000
V
Machine Model (Note 3)
> 200
Charged Device Model (Note 4)
2000
I_{Latch−Up} Latch−Up Performance
Above V_CC and Below GND at 85_C (Note 5)
$300
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. I_O absolute maximum rating must be observed.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Characteristics
DC Supply Voltage
DC Input Voltage
DC Output Voltage
V_CC = 0
High or Low State
Operating Temperature Range
Input Rise and Fall Time
V_CC = 3.3 V ± 0.3 V
V_CC = 5.0 V ± 0.5 V
Symbol
Min
Max
Unit
V_CC
V_IN
V_OUT
2.0
5.5
V
0.0
5.5
V
0.0
5.5
V
0.0
V_CC
T_A
t_r , t_f
−55
+125
°C
0
100
ns/V
0
20
A ^50%
Y
t_PLH
50% V_CC
3.0V
GND
t_PHL
V_OH
V_OL
Figure 1. Switching Waveforms
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
C_L*
*Includes all probe and jig capacitance
Figure 2. Test Circuit
http://onsemi.com
2