MC74VHC1GT66_11 Datasheet, PDF (2/9 Pages) ON Semiconductor – SPST (NO) Normally Open Analog Switch

MC74VHC1GT66
IN/OUT X_A 1
5 V_CC
OUT/IN Y_A 2
GND 3
4 ON/OFF
CONTROL
(SC−88A, TSOP−5)
Figure 1. Pinout Diagram
ON/OFF CONTROL
X1
IN/OUT X_A
1
1
OUT/IN Y_A
Figure 2. Logic Symbol
MAXIMUM RATINGS
Symbol
Characteristics
V_CC DC Supply Voltage
V_IN DC Input Voltage
V_IS Analog Output Voltage
I_IK
Input Diode Current
I_CC DC Supply Current, V_CC and GND
T_STG Storage Temperature Range
T_L
Lead Temperature, 1 mm from Case for 10 Seconds
T_J
Junction Temperature Under Bias
q_JA Thermal Resistance
SC70−5 (Note 1)
SOT23−5
Value
−0.5 to +7.0
−0.5 to +7.0
−0.5 to 7.0
−20
+25
*65 to )150
260
)150
350
230
Unit
V
V
V
mA
mA
°C
°C
°C
°C/W
P_D Power Dissipation in Still Air at 85°C
SC70−5
150
mW
SOT23−5
200
MSL Moisture Sensitivity
Level 1
F_R
V_ESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
Human Body Model (Note 2)
u2000
V
Machine Model (Note 3)
u200
Charged Device Model (Note 4)
N/A
I_Latchup Latchup Performance
Above V_CC and Below GND at 125°C (Note 5)
$500
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
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