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MC74VHC1G02_16 Datasheet, PDF (2/6 Pages) ON Semiconductor – Single 2-Input NOR Gate
MC74VHC1G02
MAXIMUM RATINGS
Symbol
Characteristics
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Input Diode Current
Output Diode Current
DC Output Current, per Pin
DC Supply Current, VCC and GND
Power Dissipation in Still Air at 85°C
−0.5 to +7.0
V
−0.5 to +7.0
V
VCC = 0
−0.5 to 7.0
V
High or Low State
−0.5 to VCC + 0.5
−20
mA
VOUT < GND; VOUT > VCC
+20
mA
+25
mA
+50
mA
SC70−5/SC−88A
150
mW
TSOP−5
200
qJA
Thermal Resistance
SC70−5/SC−88A (Note 1)
350
TSOP−5
230
°C/W
TL
Lead Temperature, 1 mm from Case for 10 Seconds
260
°C
TJ
Junction Temperature Under Bias
)150
°C
TSTG
Storage Temperature Range
*65 to )150
°C
VESD
ESD Withstand Voltage
Human Body Model (Note 2)
> 2000
V
Machine Model (Note 3)
> 200
Charged Device Model (Note 4)
N/A
ILATCHUP Latchup Performance
Above VCC and Below GND at 125°C (Note 5)
$500
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min
Max
Unit
VCC DC Supply Voltage
2.0
5.5
V
VIN
DC Input Voltage
0.0
5.5
V
VOUT DC Output Voltage
0.0
VCC
V
TA
Operating Temperature Range
−55
+125
°C
tr , tf Input Rise and Fall Time
VCC = 3.3 V $ 0.3 V
0
VCC = 5.0 V $ 0.5 V
0
100
ns/V
20
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature °C
Time, Hours
Time, Years
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
80
1,032,200
117.8
90
419,300
47.9
100
178,700
20.4
1
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
1
10
100
1000
TIME, YEARS
140
8,900
1.0
Figure 3. Failure Rate vs. Time Junction Temperature
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