MC74LCX125_05 Datasheet, PDF (2/8 Pages) ON Semiconductor – Low-Voltage CMOS Quad Buffer With 5 V−Tolerant Inputs and Outputs (3−State, Non−Inverting)

MC74LCX125
V_CC OE3 D3 O3 OE2 D2 O2
14 13 12 11 10 9 8
1234567
OE0 D0 O0 OE1 D1 O1 GND
Figure 1. Pinout: 14−Lead (Top View)
1
OE
0
2
D0
4
OE
1
5
D1
10
OE
3
2
9
O0 D2
13
OE
6
3
12
O1 D3
8
O2
11
O3
Figure 2. Logic Diagram
PIN NAMES
Pins
Function
OEn
Dn
On
Output Enable Inputs
Data Inputs
3−State Outputs
TRUTH TABLE
INPUTS
OEn
Dn
OUTPUTS
On
L
L
L
L
H
H
H
X
Z
H = High Voltage Level
L = Low Voltage Level
Z = High Impedance State
X = High or Low Voltage Level and Transitions Are
Acceptable; for I_CC reasons, DO NOT FLOAT Inputs
MAXIMUM RATINGS
Symbol
Parameter
Value
Condition
Unit
V_CC
DC Supply Voltage
−0.5 to +7.0
V
V_I
DC Input Voltage
−0.5 ≤ V_I ≤ +7.0
V
V_O
DC Output Voltage
−0.5 ≤ V_O ≤ +7.0
Output in 3−State
V
−0.5 ≤ V_O ≤ V_CC + 0.5 Output in HIGH or LOW State. (Note 1)
V
I_IK
DC Input Diode Current
−50
V_I < GND
mA
I_OK
DC Output Diode Current
−50
V_O < GND
mA
+50
V_O > V_CC
mA
I_O
DC Output Source/Sink Current
±50
mA
I_CC
DC Supply Current Per Supply Pin
±100
mA
I_GND
DC Ground Current Per Ground Pin
±100
mA
T_STG
Storage Temperature Range
−65 to +150
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. I_O absolute maximum rating must be observed.
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