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MC74AC20_06 Datasheet, PDF (2/8 Pages) ON Semiconductor – Dual 4−Input NAND Gate | |||
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MC74AC20, MC74ACT20
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Min
Unit
VCC
Supply Voltage
â²AC
2.0
5.0
6.0
â²ACT
4.5
5.0
5.5
V
VREG
tr, tf
tr, tf
TJ
TA
IOH
IOL
DC Regulated Power Voltage (Ref. to GND)
Input Rise and Fall Time (Note 1)
â²AC Devices except Schmitt Inputs
Input Rise and Fall Time (Note 2)
â²ACT Devices except Schmitt Inputs
Junction Temperature (PDIP)
Operating Ambient Temperature Range
Output Current â HIGH
Output Current â LOW
0
VCC @ 3.0 V
â
VCC @ 4.5 V
â
VCC @ 5.5 V
â
VCC @ 4.5 V
â
VCC @ 5.5 V
â
â
â
VCC
V
150
â
40
â
ns/V
25
â
10
â
ns/V
8.0
â
â
140
°C
â40
25
85
°C
â
â
â24
mA
â
â
24
mA
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
DC CHARACTERISTICS
74AC
74AC
Symbol
Parameter
VCC
(V)
TA = +25°C
TA =
â40°C to
+85°C
Unit
Conditions
Typ Guaranteed Limits
VIH
Minimum High Level
Input Voltage
3.0
1.5 2.1
2.1
4.5 2.25 3.15
3.15
5.5 2.75 3.85
3.85
VOUT = 0.1 V
V
or VCC â 0.1 V
VIL
Maximum Low Level
Input Voltage
3.0
1.5 0.9
0.9
4.5 2.25 1.35
1.35
5.5 2.75 1.65
1.65
VOUT = 0.1 V
V
or VCC â 0.1 V
VOH
Minimum Low Level
Output Voltage
3.0 2.99 2.9
2.9
4.5 4.49 4.4
4.4
5.5 5.49 5.4
5.4
IOUT = â 50 mA
V
3.0
â 2.56
2.46
4.5
â 3.86
3.76
5.5
â 4.86
4.76
*VIN = VIL or VIH
â 12 mA
V
IOH
â 24 mA
â 24 mA
VOL
Maximum Low Level
Output Voltage
3.0 0.002 0.1
0.1
4.5 0.001 0.1
0.1
5.5 0.001 0.1
0.1
IOUT = 50 mA
V
3.0
â 0.36
0.44
4.5
â 0.36
0.44
5.5
â 0.36
0.44
*VIN = VIL or VIH
V
IOL
12 mA
24 mA
24 mA
IIN
Maximum Input
Leakage Current
5.5
â ±0.1
±1.0
mA
VI = VCC, GND
IOLD
IOHD
â Minimum Dynamic
Output Current
5.5
â
â
75
5.5
â
â
â75
mA
VOLD = 1.65 V Max
mA
VOHD = 3.85 V Min
ICC
Maximum Quiescent
Supply Current
5.5
â
4.0
40
mA
VIN = VCC or GND
*All outputs loaded; thresholds on input associated with output under test.
â Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V.
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